Indian Patents. 218265:''APPARATUS AND METHOD FOR MEASURING QUALITY OF A FORWARD CHANNEL RECEIVED FROM A BASE STATION''

Title of Invention	''APPARATUS AND METHOD FOR MEASURING QUALITY OF A FORWARD CHANNEL RECEIVED FROM A BASE STATION''
Abstract	NA

Full Text

Patent Number

218265

Indian Patent Application Number

601/DELNP/2003

PG Journal Number

40/2008

Publication Date

03-Oct-2008

Grant Date

31-Mar-2008

Date of Filing

21-Apr-2003

Name of Patentee

SAMSUNG ELECTRONICS CO. LTD.

Applicant Address

416, MAETAN -DONG, PALDAL-GU,SUWON-SHI, KYUNGKI-DO, REPUBLIC OF KOREA.

#	Inventor's Name	Inventor's Address
1	JAE-SUNG JANG	JUGONG APT., #1102-203,CHUNGANG-DONG, KWACHON-SHI, KYONGGI-DO, KOREA.
2	HO-KYU CHOI	MUJIGAEMAEUL #1204-303, KUMI-DONG, PUNTANG-GU, SONGNAM-SHI,KYONGGI-DO,KOREA.
3	HWAN-JOON KWON	MIDOMANSION #1-203, TUNCHON 2-DONG,KANGDONG-GU, SEOUL, KOREA.
4	DONG-HEE KIM	565, SHINDAEBANG-DONG,TONGJAK-GU, SEOUL, KOREA.
5	na	416, MAETAN -DONG, PALDAL-GU SUWON-SHI, KYUNGKI-DO, REPUBLIC OF KOREA.
6	YOUN-SUN KIM	WOOSUNG APT.,#3-1007, TAECHI 3-DONG,KANGNAM-GU,SEOUL, REPUBLIC OF KOREA.

PCT International Classification Number

H04B 7/26

PCT International Application Number

PCT/KR02/01625

PCT International Filing date

2002-08-29

#	PCT Application Number	Date of Convention	Priority Country
1	53348/2001	2001-08-31	Republic of Korea
2	75534/2001	2001-11-30	Republic of Korea
3	66105/2001	2001-10-25	Republic of Korea