| Title of Invention | A METHOD AND SYSTEM FOR TEST STRIP QUALIFICATION. |
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| Abstract | A method of test strip qualification, said method comprising: providing a test strip comprising an assay reaction area, a first control reaction area and a second control reaction area; obtaining PT results for each reaction area; comparing results from said first control area to first control qualification criteria and results from second control area to second control qualification criteria, wherein said first control qualification criteria comprise an upper limit and a lower limit, said upper limit being at least partially dependent upon assay reaction area PT results; and outputting a message to a user indicating test strip reliability. |
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112-kol-2003-granted-abstract.pdf
112-kol-2003-granted-assignment.pdf
112-kol-2003-granted-claims.pdf
112-kol-2003-granted-correspondence.pdf
112-kol-2003-granted-description (complete).pdf
112-kol-2003-granted-drawings.pdf
112-kol-2003-granted-examination report.pdf
112-kol-2003-granted-form 1.pdf
112-kol-2003-granted-form 13.pdf
112-kol-2003-granted-form 18.pdf
112-kol-2003-granted-form 2.pdf
112-kol-2003-granted-form 26.pdf
112-kol-2003-granted-form 3.pdf
112-kol-2003-granted-form 5.pdf
112-kol-2003-granted-letter patent.pdf
112-kol-2003-granted-reply to examination report.pdf
112-kol-2003-granted-specification.pdf
112-kol-2003-granted-translated copy of priority document.pdf
| Patent Number | 219345 | ||||||||
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| Indian Patent Application Number | 112/KOL/2003 | ||||||||
| PG Journal Number | 18/2008 | ||||||||
| Publication Date | 02-May-2008 | ||||||||
| Grant Date | 30-Apr-2008 | ||||||||
| Date of Filing | 25-Feb-2003 | ||||||||
| Name of Patentee | LIFESCAN, INC. | ||||||||
| Applicant Address | 1000 GIBRALTAR DRIVE, MILPITAS, CALIFORNIA 95035-6312 | ||||||||
Inventors:
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| PCT International Classification Number | G 01 N 31/00 | ||||||||
| PCT International Application Number | N/A | ||||||||
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PCT Conventions:
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