Title of Invention

"ADHESIVE COMPOSITION, CIRCUIT CONNECTING MATERIAL, CONNECTION STRUCTURE OF CIRCUIT MEMBER, AND SEMICONDUCTOR DEVICE"

Abstract The present invention relates to a circuit-connecting material for electrical connection between opposing circuit electrodes, the circuit-connecting material comprising an adhesive composition comprising a radical generator, a thermoplastic resin and a urethane (meth)acrylate having two or more (meth)acryloyl groups and two or more urethane bonds in the molecule, and also having a divalent group represented by the following general formula (G) and/or formula (H), wherein p represents an integer of 0-10 and q represents an integer of 1-20.:
Full Text DESCRIPTION
ADHESIVE COMPOSITION, CIRCUIT CONNECTING
MATERIAL, CONNECTION STRUCTURE OF CIRCUIT
MEMBER, AND SEMICONDUCTOR DEVICE
Technical Field
(0001] The present invention relates to an adhesive composition, as
well as to a circuit-connecting material and to a circuit connection
structure and a semiconductor device that employ it.
Background Art
[0002] Several different types of adhesive materials have been used in
recent years in the fields of semiconductors and liquid crystal displays,
for anchoring of electronic parts and ·for circuit ·connection. As such
uses continue to require higher density and higher definition, the
adhesives used must also exhibit higher adhesive force and reliability.
The adherends used in bonding include printed circuit boards, organic
substrates composed of heat resistant polymers such as polyimides, and
metals such as copper, tin, nickel or aluminum and other inorganic
materials such as ITO, SbN4 and Si02• Adhesives are also used for
bonding between different types of the substrates mentioned above.
The adhesives must therefore exhibit a wide range of properties in
addition to superior adhesion, including high heat resistance and high
reliability under high-temperature, high-humidity conditions, while
also having a molecular design suitable for each adherend.
[0003] In particular, anisotropic conductive adhesives having
conductive particles dispersed in adhesives are employed as circuitconnecting
materials· (circuit-connecting adhesives) used for
connection between circuits such as between liquid crystal displays and
TCPs, between FPCs and TCPs or between FPCs and printed circuit
boards. Such adhesives used for semiconductors and liquid crystal
displays have conventionally been thermosetting resin compositions
comprising epoxy resins that exhibit high adhesion and high reliability
(for example, see Patent document 1).
[0004] The constituent components of thermosetting resm
compositions include epoxy resins and curing agents such as phenol
resins that are reactive with epoxy resins. Thermal latent catalysts
that promote reaction between epoxy resins and curing agents are also
sometimes included in adhesives. For example, one-pack type epoxy
resin adhesives employing thermal latent catalysts are employed in
film, paste or powder forms since they do not require mixture of the
base compound (epoxy resin) and the curing agent and are convenient
to use. The thermal latent catalysts are major factors determining
curing temperature and curing speed, and various compounds are used
as thermal latent catalysts from the viewpoint of room temperature
storage stability and curing speed during heating.
[0005] In actual adhesion steps using such adhesives, the adhesives
are cured under curing conditions with a 170°C-250°C temperature for
1-3 hours to obtain the desired adhesive force. However, as the
increasing integration of semiconductor elements and higher precision
of liquid crystal devices in recent years are leading to ever narrowing
pitches between elements and wirings, the heating of curing can
produce adverse effects on the surrounding materials. In addition, the
electrode widths and electrode spacings are becoming even more
extremely narrow while electrode heights are decreasing. Therefore,
it is not always possible to achieve sufficient adhesive force with
conventional circuit connection adhesives, and problems such as
shifting of wirings can occur. Moreover, since another goal is to
shorten the duration of adhesion steps to reduce cost, it is desirable to·
accomplish curing and bonding at lower temperatures and in shorter
times.
[0006] Radical-type adhesives which combine radical polymerizing
compounds such as acrylate derivatives or methacrylate derivatives
(hereinafter referred to as "(meth)acrylate derivatives") with peroxides
as radical polymerization initiators have become objects of interest in
recent years as means of achieving lower temperature and shorter
times. Radical curing with adhesives can be accomplished at low
temperature and in a short period of time because of the high reactivity
of the reactive radical species (for example, see Patent document 2).
However, it has been noted that the adhesive strength is inferior to that
of epoxy resins because of the high cure shrinkage during curing of the
radical curing adhesives. It has been found that the adhesive strength
for inorganic material or metal material substrates is particularly low.
[0007] Methods of enhancing adhesive strength, such as methods of
imparting pliability by including ether bonds in cured adhesives in
order to increase the adhesive strength, have therefore been proposed
(see Patent documents 3 and 4). Such enhancing methods employ
urethane acrylate compounds as the radical polymerizing compounds.
[Patent document 1] Japanese Patent Application Laid-open No. 1-
113480
[Patent document 2] Japanese Patent Application Laid-open No. 2002-
203427
[Patent document 3] Japanese Patent Publication No. 3522634
[Patent document 4] Japanese Patent Application Laid-open No. 2002-
285128
Disclosure of the Invention
Problems to be Solved by the Invention
[0008] Nevertheless using the aforementioned urethane acrylate
compounds can impart an excessive degree of pliability to cured
adhesives, as a result of ether bonding. The physical properties of the
adhesives are therefore inferior, due to reduction in the elastic modulus
and glass transition temperature of the cured product, and impairment
of its water resistance, heat resistance and mechanical strength. Such
adhesives cannot exhibit adequate performance (adhesive strength,
connection resistance, etc.) in reliability tests where they are allowed to
stand under high temperature, high humidity conditions of 85°C/85%
RH. The pressure-sensitive adhesive properties of such adhesives are
also too strong, and therefore when a film-like adhesive is formed by
laminating a layer of the adhesive onto a releasable support film, the
adhesive is transferred onto the backing support film while transfer
onto the adherend fails to occur satisfactorily.
[0009] In order to obtain adhesives that cure and bond at lower
temperatures and in shorter periods of time than the prior art, there may
be employed thermal latent catalysts with low activation energy.
However, using such thermal latent catalysts makes it extremely
difficult to also achieve sufficient storage stability at near room
temperature.
[00 1 0] The present invention therefore provides an adhesive
composition circuit-connecting material with an excellent balance of
properties, which despite being a radical curing adhesive exhibits
sufficiently high adhesive strength even for substrates composed of
metals and inorganic materials, has adequately high storage stability
and reliability at room temperature (20-30°C) and satisfactory transfer
properties onto adherends, and can satisfactorily achieve temporary
anchoring of flexible wiring boards and the like, as well as a circuit
connection structure and semiconductor device that employ the above.
Means for Solving the Problems
[00 11] The invention relates to an adhesive composition comprising a
radical generator, a thermoplastic resin and a urethane (meth)acrylate
having two or more radical-polymerizing groups in the molecule and a
weight-average molecular weight of 3000-30,000.
[0012] The adhesive composition of the invention exhibits
sufficiently high adhesive strength for substrates composed of metals
and inorganic materials, despite being a radical curing adhesive.
According to the invention it is possible to provide an adhesive
composition that has adequately high storage stability and reliability at
room temperature (20-30°C) and satisfactory transfer properties onto
adherends, and that can satisfactorily achieve temporary anchoring of
flexible wiring boards and the like.
[0013] The invention relates to the aforementioned adhesive
composition wherein the urethane (meth)acrylate includes a urethane
(meth)acrylate having in the molecule a divalent organic group
represented by the following formula (B) and/or the following general
formula (C).
[Chemical Formula 1]
CH3
(c)
H$C
In formula (C), R5 and R6 respectively represent hydrogen and methyl,
or methyl and hydrogen.
[00 14] The invention also relates to the aforementioned adhesive
composition wherein the urethane (meth)acrylate includes a urethane
(meth)acrylate having in the molecule one or more groups selected
from the group consisting of divalent organic groups represented by the
following general formulas (D), (E) and (F).
[Chemical Formula 2]
~H2 H2 H H2 H2 t -o c -c -T-c -c -o
CHJ I
{ 0)
The letters l, m and n in formulas (0), (E) and (F) each represent an
integer of 1-60.
[00 15] The invention further relates to the aforementioned adhesive
composition wherein the urethane (meth)acrylate includes a compound
represented by the following general formula (A).
[Chemical Formula 3]
R1
I
H2C=c-C-O-R2-0-C-N-R3-N-H
II II I
0 0 H
0 C-N-R3-N-C-O-R4-0 c=O
II I I II (A)
0 H H 0
In formula (A), R1 represents hydrogen or a methyl group, R2
represents a · C 1-4 straight-chain or branched alkylene group, R3
represents a divalent organic group with an aliphatic hydrocarbon
group, R4 represents a straight-chain or branched divalent diol
compound residue, and k represents an integer of 1-60. The plurality
of groups R1
, R2 and R3 in the molecule and the group R4 where k is an
integer of 2-60 may be the same or different.
[00 16] The invention further relates to the aforementioned adhesive
composition wherein R3 is at least one group selected from the group
consisting of divalent organic groups represented by formula (B) and
general formula (C) above.
(00 17] The invention further relates to the aforementioned adhesive
composition wherein (-O-R4-0-) is at least one group selected from the
group consisting of divalent organic groups represented by general
formulas (D), (E) and (F) above.
(00 18] The invention still further relates to an adhesive composition
comprising a radical generator, a thermoplastic resin and a urethane
(meth)acrylate having two or more (meth)acryloyl groups and two or
more urethane bonds in the molecule, and also having a divalent group
represented by.the following general formula (G) and/or formula (H).
[Chemical Formula 4]
(G)
In formula (G), p represents an integer of 0-10 and q represents an
integer of 1-20.
(0019] The invention further relates to the aforementioned adhesive
composition wherein the urethane (meth)acrylate includes a compound
represented by the following general formula (I).
[Chemical Formula 5]
R11
I
H2C=c-C-O-R12-0-C-N-R13-N-H
II II I
0 0 H
0 C-N-R13-N-C-O-R14-0 c=O
II I I II (I)
0 H H 0
R11
·R12-o-c-6=cH2
II
0
In formula (I), R11 represents hydrogen or a methyl group; R12
represents a Cl-4 straight-chain or branched alkylene group, R13
represents a divalent organic group with an aliphatic hydrocarbon
group, R14 represents a divalent group represented by general formula
(G) and/or formula (H) above, and r represents an integer of 1~60.
The plurality ofR11
, R12 and R13 groups in the molecule and R14 where
r is an integer of2-60 may be the same or different.
[0020] The invention still further relates to the aforementioned
adhesive composition wherein R12 represents an ethylene group, R13 is
a group represented by formula (B) above, pis an integer of 1-10 and r
is an integer of 1~40.
[0021] The invention still further relates to the aforementioned
adhesive composition wherein the temporary anchoring force for
temporary anchoring onto a flexible wiring board is 50 gf/cm-150
gf/cm.
[0022] The invention still further relates to the aforementioned
adhesive composition wherein the 25°C. viscosity of the urethane
(meth)acrylate is 5.0 Pa·s or greater.
[0023] The invention still further relates to the aforementioned
adhesive composition which comprises 10-250 parts by weight of the
urethane (meth)acrylate and 0.05-30 parts by weight of the radical
generator with respect to 100 parts by weight of the thermoplastic
. resm.
[0024] The invention still further relates to the aforementioned
adhesive composition which also comprises a vinyl compound
containing one or more phosphate groups in the molecule.
[0025] The invention still further relates to the aforementioned
adhesive composition which comprises 0.1-20 parts ·by weight of the
~
10
vinyl compound with respect to 100 parts by weight of the
thermoplastic resin.
[0026] The invention still further relates to the aforementioned
adhesive composition which also comprises conductive particles. .
[0027] The invention still further relates to the aforementioned
adhesive composition· which comprises 0.5-30 parts by weight of the
conductive particles with respect to 100 parts by weight of the
thermoplastic resin.
[0028] The invention still further relates to a circuit-connecting
material for electrical connection between opposing circuit electrodes,
the circuit-connecting material comprising the aforementioned
adhesive composition.
[0029] The invention still .further relates to a circuit member
connection structure provided with a first circuit member obtained by
forming a first circuit electrode on the main surface of a first circuit
board, a second circuit member obtained by forming a second circuit
electrode on the main surface of a second circuit board, and a circuitconnecting
member formed between the main surface of the first circuit
board and the main surface of the second circuit board, electrically
connecting the first circuit electrode and second circuit electrode which
are laid facing each other, wherein the circuit-connecting member is the
product of curing the circuit-connecting material.
[0030] The invention still further relates to a semiconductor device
comprising a semiconductor element, a substrate on which the
semiconductor element is mounted, and a semiconductor element
connecting member provided between the semiconductor element and
..-WI/
the substrate and electrically connecting the semiconductor element
and the substrate, characterized in that the semiconductor element
connecting member is the product of curing the aforementioned
adhesive composition.
Effect of the Invention
[0031] The present invention provides an adhesive composition with
an excellent balance of properties, which despite being a radical curing
adhesive, exhibits . sufficiently high adhesive strength even for
substrates composed of metals and inorganic materials, has adequately
high storage stability and reliability at room temperature (20-30°C) and
satisfactory transfer properties onto adherends, and can satisfactorily
achieve temporary anchoring of flexible wiring boards and the like.
Brief Description of the Drawings
[0032] Fig. 1 is a simplified cross-sectional vtew showing an
embodiment of a circuit member connection structure according to the
invention.
Fig. 2 is a flow chart for connection of a circuit member according to
the invention.
Fig. 3 is a simplified cross-sectional view showing an embodiment of a
semiconductor device according to the invention.
Explanation of Symbols
(0033] 2: Semiconductor device, 7: conductive particles, 10: circuitconnecting
member, 11: insulating material, 20: first circuit member,
21: first circuit board, 22: first circuit electrode, 30: second circuit
member, 31: second circuit board, 32: second circuit electrode, 40:
semiconductor element connecting member, 50: semiconductor
-l-r
iZ
element, 60: substrate, 61: circuit pattern, 70: sealing material.
Best Mode for Carrying Out the Invention
[0034] Preferred embodiments of the invention will now be explained
in detail, with reference to the accompanying drawings as necessary.
Throughout the drawings, corresponding elements will be referred to
by like reference numerals and will be explained only once. Unless
otherwise specified, the vertical and horizontal positional relationships
are based on the positional relationships in the drawings. The
dimensional proportions in the drawings are not restricted to the
proportions shown. The term "(meth)acrylic" used throughout the
present specification refers to "acrylic" and its corresponding
"methacrylic", the term "(meth)acrylate" refers to "acrylate" and its
corresponding "methacrylate", the term "(meth)acryloxy" refers to
"acryloxy" and its corresponding "methacryloxy", and the term
"(meth)acryloyl" refers to "acryloyl" and its corresponding
"methacryloyl".
[0035] The adhesive composition according to the first embodiment of
the invention comprises a radical generator, a thermoplastic resin and a
urethane (meth)acrylate having two or more radical-polymerizing
groups in the molecule and a weight-average molecular weight of
3000-30,000. Each of the components mentioned above will now be
described in detail.
[0036] The radical generator, also known as radical polymerization
initiator, is not particularly restricted so long as it is a compound that
generates radicals by heat or light. Examples of radical generators
include peroxides, azo compounds and the like, and they may be
selected in consideration of the desired connection temperature,
connection time and storage stability (hereinafter also referred to as
"shelf life"). Such radical generators may be used alone or in
combi~ations of two or more. From the standpoint of high reactivity
and long shelf life, the radical generator preferably is an organic
peroxide with a 10 hour half-life temperature of 40°C or higher and a 1
minute half-life temperature of no higher than 180°C, and most
preferably it is an organic peroxide with a 10 hour half-life temperature
of 50°C or higher and a 1 ~ute half-life temperature of no higher
than 170°C. If the connection time is 10 seconds or shorter, the
radical generator content with respect to the total adhesive composition
is preferably .1-20 wt% and more preferably 2-15 wt% in order to
achieve a satisfactory reaction rate.
[0037] As specific examples of the aforementioned organic peroxides
there may be mentioned diacyl peroxides, peroxy dicarbonates,
peroxyesters, peroxyketals, dialkyl peroxides, hydroperoxides and silyl
peroxides, as well as their derivatives. They may be used alone or in
combinations of two or more. The organic peroxide used is
preferably selected from the group consisting of peroxyesters, dialkyl
peroxides, hydroperoxides and silyl peroxides, or their derivatives.
Preferred organic peroxides have no more than 5000 ppm of chloride
ions and organic acids in the radical generator, with low organic acid
generation after thermolysis, so that corrosion of connection terminals
of circuit members can be further inhibited.
[003 8] As examples of diacyl peroxides and their derivatives there
may be mentioned isobutyl peroxide, 2,4-dichlorobenzoyl peroxide,
3,5,5-trimethylhexanoyl peroxide, octanoyl peroxide, lauroyl peroxide,
stearoyl peroxide, succinic peroxide, benzoylperoxytoluene and
benzoyl peroxide. They may be used alone or in combinations of two
or more.
(0039] As examples of peroxy dicarbonates and their derivatives there
may be mentioned di-n-propylperoxy dicarbonate, diisopropylperoxy
dicarbonate, his( 4-t-butylcyclohexyl)peroxy dicarbonate, di-2-
ethoxymethoxyperoxy dicarbonate, di(2-ethylhexylperoxy)dicarbonate,
dimethoxybutylperoxy dicarbonate and di(3-methyl-3-
methoxybutylperoxy) dicarbonate. They may also be used alone or in
combinations of two or more.
[0040] As examples of peroxyesters and their derivatives there may
be mentioned cumylperoxy neodecanoate, 1,1,3,3-
tetramethylbutylperoxy neodecanoate, 1-cyclohexyl-1-
methylethylperoxy neodecanoate, t-hexylperoxy neodecanoate, tbutylperoxy
pivalate, 1,1 ,3,3-tetramethylbutylperoxy-2-ethyl
hexanoate, 2,5-dimethyl-2,5-di(2-ethylhexanoylperoxy)hexane, 1-
cyclohexyl-1-methylethylperoxy-2-ethyl hexanoate, t-hexylperoxy-2-
ethyl hexanoate, t-butylperoxy-2-ethyl hexanonate, t-butylperoxy
isobutyrate, 1, 1-bis(t-butylperoxy)cyclohexane, t-hexylperoxyisopropyl
monocarbonate, t-butylperoxy-3,5,5-trimethyl hexanoate, t-butylperoxy
Ia urate, 2,5-dimethyl-2,5-di(m-toluoylperoxy )hexane, tbutylperoxyisopropyl
monocarbonate, t-butylperoxy-2-ethylhexyl
monocarbonate, t-hexylperoxybenzoate, t-butylperoxy acetate and
dibutylperoxy hexahydroterephthalate. They may also be used alone
or in combinations of two or more.
·~
15
[0041] As examples of peroxyketals and their derivatives there may
be mentioned 1, 1-bis(t-hexylperoxy)-3,3,5-trimethylcyclohexane, 1,1-
bis(t-hexylperoxy)cyclohexane, 1,1-bis(t-butylperoxy)-3,3,5-
trimethylcyclohexane, 1, 1-(t-butylperoxy)cyclododecane and 2,2-bis(tbutylperoxy)
decane. They may also be used alone or in combinations
of two or more.
[0042] As examples of dialkyl peroxides and their derivatives there
may be mentioned a,a'-bis(t-butylperoxy)diisopropylbenzene, dicumyl
peroxide, 2,5-dimethyl-2,5-di(t-butylperoxy)hexane and t-butylcumyl
peroxide. They may also be used alone or in combinations of two or
more.
[0043] As examples of hydroperoxides and their derivatives there
may be mentioned diisopropylbenzene hydroperoxide and cumene
hydroperoxide. They may also be used alone or in combinations of
two or more.
[0044] As examples of silyl peroxides and their derivatives there may
be ·mentioned t-butyltrimethylsilyl peroxide, bis(t-butyl)dimethylsilyl
peroxide, t-butyltrivinylsilyl peroxide, bis(t-butyl)divinylsilyl peroxide,
tris(t-butyl)vinylsilyl peroxide, t-butyltriallylsilyl peroxide, bis(tbutyl)
diallylsilyl peroxide and tris(t-butyl)allylsilyl peroxide. They
may also be used alone or in combinations of two or more.
[0045] From the viewpoint of a satisfactory balance between stability,
reactivity and compatibility, the radical generator is preferably a
peroxyester or a derivative thereof having a 1 minute half-life
temperature of 90-175°C and a molecular weight of 180-1000.
[0046] In order to prevent corrosion of the connection terminals of the
~
16
circuit members, the chloride ion or organic acid content of the radical
generator is preferably no greater than 5000 ppm by weight. The
radical generator is more preferably one with minimal production of
organic acids after thermolysis. In order to improve the stability of
the fabricated circuit-connecting material, the radical generator
preferably has a mass retention of at least 20 wto/o after standing at
room temperature and ordinary pressure for 24 hours. Here, the
"mass retention" is the mass proportion of the radical generator
remaining after standing based on the mass of the radical generator
before standing.
(0047] Such radical generators may also be used in admixture with
triggers, inhibitors and the like.
[0048] These radical generators are also preferably coated with a
polyurethane-based or polyester-based polymer substance and made
into microcapsules for an extended pot life.
(0049] The mixing proportion of the radical generator in the adhesive
composition is preferably 0.05-30 parts by weight and more preferably
0.1-20 parts by weight with respect to 100 parts by weight of the
thermoplastic resin described hereunder. If the mixing proportion is
below 0.05 part by weight the adhesive composition will tend to be
difficult to cure, while if it exceeds 30 parts by weight the storage
stability will tend to be lower.
[0050] The thermoplastic resin used is not particularly restricted and
may be any known one. As examples of such thermoplastic resins
there may be mentioned polyimides, polyamides, phenoxy resins,
poly(meth)acrylates, polyimides, polyurethanes, polyesters and
.--}6-
i7
polyvinyl butyral, as well as their derivatives. They may also be used
alone or in combinations of two or more. These thermoplastic resins
may also have siloxane bonds or fluorine-substituted groups in the
molecule. When such thermoplastic resins are used in admixture, the
mixed thermoplastic resins are preferably either completely miscible or
produce microphase separation to a state of opacity.
[0051] The thermoplastic resin will exhibit more satisfactory film
formability with a larger molecular weight, and the melt viscosity
which affects the flow property as an adhesive may be set within a
wide range. The molecular weight of the thermoplastic resin is not
particularly restricted so long as it can achieve the object of the
invention, but for most purposes the molecular weight is preferably
5000-150,000 and more preferably 10,000-80,000 as the weightaverage
molecular weight. A weight-average molecular weight of
less than 5000 will tend to reduce the film formability, while greater
than 150,000 will tend to lower the compatibility with the other
components. Throughout the present specification, the weightaverage
molecular weight is measured by GPC (gel permeation
chromatography) and calculated based on standard polystyrene.
[0052] The urethane (meth)acrylate having two or more radicalpolymerizing
groups in the molecule and a weight-average molecular
weight of 3000-30,000 is not particularly restricted so long as it is a
compound with at least two urethane bonds and one or more
(meth)acrylate structures in the molecule.
[0053] The weight-average molecular weight of the urethane
(meth)acrylate used for this embodiment is the value measured by GPC
(gel permeation chromatography) and calculated based on standard
polystyrene. From the viewpoint of improving the heat resistance,
flow property and adhesion, the urethane (meth)acrylate for this
embodiment preferably has a weight-average molecular weight of
3000-30,000 and more preferably 5000-15,000. If the urethane
(meth)acrylate has a weight-average molecular weight within the
aforementioned numerical valu~ range, it will be possible to impart
suitable adhesive force and pressure-sensitive adhesive force to the
adhesive composition, to accomplish temporary anchoring with high
temporary anchoring force for tape carrier packages (TCP), chip-onflexes
(COF) and flexible printed circuit boards ·(FPC), and to obtain
satisfactory transfer onto adherends. If the weight-average molecular
weight is less than 3000, the crosslink density will be increased and
cure shrinkage will tend to lower the adhesive strength of the adhesive
composition. If the weight-average molecular weight of the urethane
(meth)acrylate is less than 3000, the pressure-sensitive adhesive
property of the adhesive composition will be increased. Therefore,
when a tape product is formed by laminating a layer comprising the
adhesive composition with a releasable support film and the product is
wound around a winding core of several tens of meters or larger and
allowed to stand for an extended period at room temperature, the layer
comprising the adhesive composition is transferred onto the backing
releasable support film, tending to prevent the desired tape product
from being extracted from the reel. In addition, after the layer
comprising the adhesive composition has been attached to a flexible
wiring board, the layer cannot be easily released from the flexib.le
wiring board and the repairability thus tends to be impaired. On the
other hand, a weight-average molecular weight exceeding 30,000 will
tend to lower the crosslink density and reduce the connection reliability
of the adhesive composition. In addition, the pressure-sensitive
adhesive property of the adhesive composition will become too weak,
making it very difficult to achieve transfer onto circuit boards. Also,
when a flexible wiring board is attached onto the layer comprising the
adhesive composition, the flexible wiring board will be more prone to
flaking.
[0054] The weight-average molecular weights of the urethane
(meth)acrylates mentioned throughout the present specification were
measured under the following conditions.
Measuring apparatus: GPC-8020 (trade name ofTosoh Corp.)
Detector: RI-8020 (trade name ofTosoh Corp.)
Column: Gelpack GL-A-160-S and GL-A150-SG2000Hhr (both trade
names ofHitachi Chemical Co., Ltd.) columns linked in series.
Sample concentration: 120 mg/3 mL
Solve~t: Tetrahydrofuran
Injection rate: 60 ~
Pressure: 30 kgf/cm2
Flow rate: 1.00 mL/min
(0055] The urethane (meth)acrylate of this embodiment preferably
has a divalent organic group represented by the following formula (B)
and/or general formula (C) in the molecule.
[Chemical Formula 6]
.--l-9-'
cH,
(B-) (C)
In formula (C), R' and R6 respectively represent hydrogen and methyl
or methyl and hydrogen.
[0056] This will allow further improvement in the adhesion and
repairability of the adhesive composition. From the same viewpoint,
the urethane (meth)acrylate of this embodiment preferably has both of
the aforementioned divalent organic groups in the molecule. In cases
where the urethane (meth)acrylate of this embodiment has both of the
aforementioned divalent organic groups in the molecule, there is no
particular limitation on their proportion. · When the urethane·
(meth)acrylate of this embodiment has a divalent organic group
represented by general formula (C) above in the molecule, it rna~ have
one or more divalent organic groups of that type.
[0057] By introduction of asymmetrical or branched molecular chains
such as the aforementioned divalent organic groups, for example, into
the urethane (meth)acrylate of this embodiment, the cured adhesive
composition will exhibit suitable pliability, adhesion and pressuresensitive
adhesive properties. In addition, high reliability can be
ensured for connections formed between different materials using the
adhesive composition.
[0058] From the standpoint of improving the flow property, adhesion
and pressure-sensitive adhesive property~ the urethane (meth)acrylate
of this embodiment preferably includes a urethane (meth)acrylate
. ...,,
having at least one group in the molecule selected from the group
consisting of divalent organic groups represented by the following
general formulas (D), (E) and (F).
[Chemical Formula 7]
( 0)
fH H2 H H2 t -o T-c -T-c -o (E)
CH3 CH3 m
In formulas (D); (E) and (F), 1, m and n each represent an integer of 1-
60.
[0059] Urethane (meth)acrylates having more than one of such groups
may comprise them in any desired proportion. When a plurality of
urethane (meth)acrylates have such groups, the proportion of the
groups in the total urethane (meth)acrylates in the adhesive
composition may be as desired.
[0060] If branched molecular chains are introduced into the
aforementioned urethane (meth)acrylates not at the ends but within the
chains, with a suitable distance between the ether groups, it is possible
to impart a suitable degree of pliability, adhesion and pressure-sensitive
adhesion to the cured adhesive composition of this embodiment, to
obtain high reliability for connection between different types of
materials.
[0061] The urethane (meth)acrylate of this embodiment preferably
contains a compound represented by the following general formula (A).
[Chemical Formula 8]
R1
I
H2C=c-C-O-R2-0-C-N-R3-N-H
II II I
0 0 H
C-N-R3-N--C-O-R4-0 c=O
II I I II
0 H H 0
R1
I
R2-o-c-c=cH2
II
0
(A)
In formula (A), R1 represents hydrogen or a methyl group, R2
represents a C 1-4 straight-chain or branched alkylene group, R3
represents a divalent organic group with an aliphatic hydrocarbon
group, R4 represents a straight-chain or branched divalent diol residue
and k represents an integer of 1-60. The plurality of groups R\ R2
and R3 in the molecule and the group R4 where k is an integer of 2-60
may be the same or different.
(0062] The urethane (meth)acrylate of this embodiment which is a
compound represented by general formula (A) above may be obtained,
for example, by reacting a diol compound with a diisocyanate
compound and a (meth)acrylate compound which has an alcoholic
hydroxyl group. Alternatively, the urethane (meth)acrylate of this
embodiment may be obtained by reacting a diisocyanate compound
with a (meth)acrylate which has an alcoholic hydroxyl group.
(0063] As examples of diisocyanate compounds there may be
mentioned diisocyanates, including aromatic diisocyanates such as 2,4-
23
tolylene diisocyanate, 2,6-tolylene diisocyanate, xylene-1 ,4-
diisocyanate, xylene-1 ,3 -diisocyanate, 4,4'-diphenylmethane
diisocyanate, 2,4'-diphenylmethane diisocyanate, 4,4'-diphenyl ether
diisocyanate, 2,2'-diphenylpropane-4,4'-diisocyanate, 3 ,3'-
dimethyldiphenylmethane-4,4'-diisocyanate, 4,4'-dipheny I propane
diisocyanate, 1 ,3-diisocyanatebenzene, 1 ,4-diisocyanatebenzene,
naphthylene-1 ,4-diisocyanate, naphthylene-1 ,5-diisocyanate and 3,3'dimethoxydiphenyl-
4,4'-diisocyanate; aliphatic diisocyanates such as
tetramethylene diisocyanate, hexamethylene diisocyanate,
decamethylene diisocyanate, lysine diisocyanate, trans-I ,4-cyclohexane
diisocyanate and 2,2,4-trimethylhexane diisocyanate; and alicyclic
diisocyanates such as isophorone diisocyanate, hydrogenated tolylene
diisocyanate, hydrogenated xylene diisocyanate, hydrogenated
diphenylmethane diisocyanate and tetramethylxylene diisocyanate.
These may also be used alone or in combinations of two or more.
Particularly preferred as diisocyanate compounds are aliphatic
diisocyanates such as 2,2,4-trimethylhexane diisocyanate and
hexamethylene diisocyanate.
[0064] As examples of dial compounds there may be mentioned ether
dials, ester dials and carbonate dials, as well as condensation products
and copolymers obtained using one or more of them as starting
materials. These may also be used alone or in combinations of two or
more.
[0065] As examples of ether dials there may be mentioned polyol
compounds including straight-chain or branched alkylene glycol or dial
compounds such as ethylene glycol, ·1 ,3-propanediol, propylene glycol,
2,3-butanediol, 1 ,4-butanediol, 2-ethylbutane-1 ,4-diol, 1 ,5-pentanediol,
1 ,6-hexanediol, 1, 7-heptanediol, 1 ,8-octanediol, 1 ,9-nonanediol, 1,10-
decanediol, 1 ,9-decanediol, 1 ,9-nonanediol, 1 ,4-cyclohexanediol-1 ,4-
dimethylol, 2,2-diethylpropane-1 ,3-diol, 2,2-dimethylpropane-1 ,3-diol,
3-methylpentane-1 ,4-diol, 3-methyl-1 ,5-pentanediol, 2,2-diethylbutane-
1 ,3-diol, 4,5-nonanediol, diethylene glycol, triethylene glycol,
dipropylene glycol, neopentyl glycol, glycerin, pentaerythritol,
erythritol, sorbitol, mannitol, trimethylolpropane, trimethylolethane,
2,2-dimethyl-3-hydroxypropyl-2,2-dimethyl-3-hydroxy propionate and
2-butene-1 ,4-diol; and other polyhydric alcohol compounds such as
bisphenol A, hydroquinones and their alkylene oxide adducts, as well
as condensation products and copolymers obtained using one or more
of them as starting materials. These may also be used alone or in
combinations of two or more.
[0066] An ester diol may be obtained by condensation polymerization
of one or more different dicarboxylic acids and diol compounds by
ordinary methods. As dicarboxylic acids there may be mentioned
aromatic dicarboxylic acids such as terephthalic acid, isophthalic acid,
phthalic acid, 1 ,4-naphthalenedicarboxylic acid, 2,5-
naphthalenedicarboxylic acid, 2,6-naphthalenedicarboxylic acid,
naphthalic acid, biphenyldicarboxylic acid and 1 ,2-bis(phenoxy )ethanep,
p-dicarboxylic acid, as well as their anhydrides and ester-forming
derivatives; and aromatic hydroxycarboxylic acids such as phydroxybenzoic
acid and p-(2-hydroxyethoxy)benzoic acid, as well as
their ester-forming derivatives. As other examples of dicarboxylic
acids there may be mentioned aliphatic dicarboxylic acids such as
succinic acid, adipic acid, azelaic acid, sebacic acid, maleic anhydride
and fumaric acid, alicyclic dicarboxyiic acids such as 1,3-
cyclopentanedicarboxylic acid and 1 ,4-cyclohexanedicarboxylic acid,
and their anhydrides and ester-forming derivatives. The ester dial
may be of a single type or a. combination ofmore_than one types.
[0067] As examples of carbonate dials there may be mentioned
dialkyl carbonates, dialkylene carbonates and diphenyl carbonates, as
well as polycarbonatediols of condensation products or copolymers
obtained using one or more of them as starting materials. These may
be used alone or in combinations of two or more.
(0068] The number of repeating units k of the urethane (meth)acrylate
represented by general formula (A) is preferably 1-50 and more
preferably 5-30. If the number of repeating units k is greater than 60, ·
the crosslink density will tend to be lower and the connection reliability
reduced.
(0069] From the viewpoint of improving adhesion and repairability,
R3 in general formula (A) preferably has one or more groups selected
from the group consisting of divalent organic groups represented by
formula (B) and general formula (C) above, and more preferably it is at
least one group selected from the group consisting of divalent organic
groups represented by formula (B) and general formula (C) above.
One group represented by general formula (C) may be used alone, or
two or more different ones may be used in combination.
(0070] By introducing an asymmetric or branched molecular chain
into R3 of general formula (A), it is possible to impart suitable
pliability, adhesion and/or pressure-sensitive adhesion to the cured
adhesive composition. This can produce high reliability for
connections. formed using the adhesive composition of this
embodiment, even for connections between materials of different types.
[0071] From the standpoint of improying the flow property, adhesion
and pressure-sensitive adhesion, the divalent group (-O-R4-0-) in
general formula (A) preferably has at least one group selected from the
group consisting of divalent organic groups represented by general
formulas {D), (E) and {F), and more preferably it is one or more groups
selected from the group consisting of divalent organic groups
represented by general formulas {D), (E) and (F). When two or more
groups selected from the group consisting of divalent organic groups
represented by general formulas {D), (E) and (F) are introduced into the
molecule of the urethane (meth)acrylate, there is no particular
limitation on their proportion.
[0072] If branched molecular chains are introduced as (-O-R4-0-) not
at the ends but within the chain of the compound represented by
general formula (A), it is possible to impart a suitable degree of
pliability, adhesion and/or pressure-sensitive adhesion to the cured
adhesive composition. This can produce high reliability for
connections formed using the adhesive composition of this
embodiment, even for connections between materials of different types.
[0073] The adhesive composition according to the second
embodiment of the invention comprises a radical generator, a
thermoplastic resin and a urethane (meth)acrylate having two or more
(meth)acryloyl groups and two or more urethane bonds in the molecule,
and having a divalent group represented by the following general
formula (G) and/or the following formula (H).
[0074] The radical generator and thermoplastic resin may be the same
as the radical generator and thermoplastic resin used for the flrst
~mbodiment, and they will not be explained again here.
[0075] The urethane (meth)acrylate of this embodiment has two or
more (meth)acryloyl groups and two or more urethane bonds in the
molecule, and a divalent group represented by the following general
formula (G) and/or the following formula (H).
[Chemical Formula 9]
(G)
In formula (G), p represents an integer of 0-10 and q represents an
integer of 1-20.
[0076] When the urethane (meth)acrylate has two or more groups
represented by general formula (G) and/or formula (H) above in the
molecule, they may be in any desired proportion.
[0077] The urethane (meth)acrylate of this embodiment is preferably
one represented by the following general formula (I).
[Chemical Formula 10]
0 C-N-R13-N-C-O-R14-0 c=O
II I I II (I)
0 H H 0
In formula {1), R 11 represents hydrogen or a methyl group, R 12
represents a C 1-4 straight-chain or branched alkylene group, R 13
represents a divalent organic group with an aliphatic hydrocarbon
group, R14 represents a divalent organic group and r represents an
integer of 1-60. The plurality of R11
, R12 and R13 groups in the
molecule and R14 where r is an integer of 2-60 may be the same or
different.
[0078] From the viewpoint of improving the heat resistance, flow
property and adhesion, R14 preferably has a group represented by
general formula (G) and/or formula (H) above, and more preferably it
is a group represented by general formula (G) and/or formula (H)
above.
[0079] In general formula (I), the number of repeating units r is more
preferably 1-40 and even more preferably 3-20. If r exceeds 40, the
crosslink density will tend to be reduced and the connection reliability
of the adhesive composition will tend to be lower.
[0080] The weight-average molecular weight of the urethane
(meth)acrylate of this embodiment is not particularly restricted but is
preferably 1000-50,000 and more preferably 5000-30,000. If the
weight-average molecular weight is less than 1 000, the adhesive force
of the adhesive composition will tend to be reduced due to cure
shrinkage. If the weight-average molecular . weight exceeds 50,000,
the crosslink density and connection reliability will tend to be reduced.
[0081] The urethane (meth)acrylate of this embodiment may employ
starting materials for introduction of the groups represented by general
formula (G) and/or formula (H) above, and the synthesis methods and
materials used may be those described in detail for the first
embodiment. The starting materials for introduction of groups
represented by general formula (G) and formula (H) may be
compounds having OH groups at both ends.
[0082] According to the invention, the 25°C viscosity of the urethane
(meth)acrylate is preferably 5.0 Pa·s or greater. If the viscosity is less
than 5.0 Pa·s, the viscosity of the adhesive composition as a whole will
be reduced, thus tending to impair the workability and repairability.
[0083] The mixing proportion of the urethane (meth)acrylate in the
adhesive composition of the invention is preferably 10-250 parts by
weight and more preferably 30-150 parts by weight with respect to 100
parts by weight of the thermoplastic resin. If the mixing proportion is
below 1 0 parts by weight the adhesive composition will tend to have
lower heat resistance after curing, while if it exceeds 250 parts by
weight the film formability will tend to be poor when the adhesive
composition is used to form a film.
[0084] The adhesive composition of the invention preferably further
comprises a vinyl compound with one or m~re phosphoric acid groups
in the molecule. The vinyl compound with one or more phosphoric
acid groups in the molecule is not particularly restricted and may be
any known compound, but preferred are those having (meth)acryloyloxy
groups in the molecule. As examples of such vinyl compounds there
may be mentioned compounds represented by the following general
formulas (J), (K) and (L ). ·
[Chemical Formula 11]
. R25 0
R24 f / ~_LO 1 ~-OH ( L ) l\H le Tf1
OH
In formula (J), R21 represents a (meth)acryloyloxy group, R22 represents
hydrogen or a methyl group and a and b each independently represent a
integer of 1-8. In cases where more than one of each R21
, R22
, a and b
are present, they n;tay be either the same or different. In formula (K),
R23 represents a (meth)acryloyloxy group, and c and d each independently
represent an integer of 1-8. In cases where more than one of each R23
,
c and d are present, they may be either the same or different. In
4.. . 25
formula (L), R2 represents a (meth)acryloyloxy group, R represents
hydrogen or a methyl group, and e and f each independently represent
.---W-- -·
an integer of 1-8.
(0085] As specific examples of vinyl compounds with one or more
phosphoric acid groups in the molecule there may be mentioned acid
phosphooxyethyl methacrylate, acid phosphooxyethyl acrylate, acid
phosphooxypropyl methacrylate, acid
phosphooxypolyoxyethyleneglycol monomethacrylate, acid
phosphooxypolyoxypropyleneglycol monomethacrylate, 2,2'-
di(meth)acryloyloxy~ethyl phosphate, EO (ethylene oxide )-modified
phosphoric acid dimethacrylate, and the like.
[0086] The mixing proportion of the vinyl compound with one or
more phosphoric acid groups in the molecule for the adhesive
composition is preferably 0.1-15 parts by weight and more preferably
0.5-10 parts by weight with respect to 50 parts by weight of the
thermoplastic resin. If the mixing proportion is less than 0.1 part by
weight, it may be difficult to obtain high adhesive strength. If the.
mixing proportion exceeds 15 parts by weight, the cured adhesive
composition will have inferior physical properties particularly in regard
to adhesive strength, while the connection reliability will also be
reduced.
[0087] The adhesive composition of the invention also preferably
contains conductive particles. This can impart even better connection
reliability to the cured adhesive composition. The conductive
particles are not particularly restricted so long as they have sufficient
conductivity to permit electrical connection. As examples of
conductive particles there may be mentioned metallic particles
containing Au, Ag, Ni, Cu, Co or alloys such as solder, and carbon.
,.
The conductive particles may also be in a multilayer form composed of
particles with a core of non-conductive glass, ceramic, plastic or the
like coated with a film comprising a conductive substance such as the
aforementioned metals, or with particles comprising a conductive
substance such as the aforementioned metals. The thickness of the
coated film is preferably at least 10 nm in order to obtain more reliable
conductivity.
[0088] When using such multilayered conductive particles or heatfusible
metallic particles as the conductive particles, the conductive
particles will be deformable under heat and pressure. When using an
adhesive composition containing such conductive particles for
connection between circuits, therefore, the contact area between the
circuit and the conductive particles will be increased, allowing
variations in thickness between electrodes to be absorbed, and this is
preferred from the standpoint of reliability.
[0089] Also, fme particles obtained by further coating the surfaces· of
conductive particles with a resin film can provide additional inhibition
against shorting due to contact between the fine particles. Because
insulation between electrode/circuit insulation can be improved,
therefore, these may be added to the adhesive composition either alone
or in admixture with conductive particles.
[0090] The mean particle size of the conductive particles is preferably
1-18 IJll1 from the viewpoint of obtaining excellent dispersibility and
conductivity. The content of the conductive particles in the adhesive
composition is preferably 0.1-30 vol%, more preferably 0.1-20 vol%
and even more preferably 0.1-10 vol%. If the conductive particle
..-3r
33
content is less than 0.1 part by volume the cured adhesive composition
will tend to have inferior conductivity, while if it is greater than 30
parts by volume, using the adhesive composition for connection
between the circuits will render connections between the insulated
circuits more prone to shorting. For the same reason, the conductive
particle content is also preferably 0.5-30 parts by weight with respect to
100 parts by weight of the thermoplastic resin.
[0091] The conductive particle content is determined based on the
volume of each component in the adhesive composition before curing
at 23°C. The volume of each component may be the volume
converted from mass based on the specific gravity. The volume may
also be calculated as the increased volume resulting after loading the
components into a vessel containing a suitable solvent (water, alcohol,
etc.) that sufficiently wets the components, without dissolving or
swelling the components in a graduated cylinder or the like.
[0092] The adhesive composition of the invention may also be used
with appropriately added adhesion aids such as coupling agents
(alkoxysilane derivatives or silazane derivatives), adhesion enhancers,
leveling agents and the like. Specifically, compounds represented by
the following general formula (M) are preferred, and compounds
represented by the following general formula (N) are more preferred.
(Chemical Formula 12]
R31
R32-~t-(-~21g--R34 ( M )
R33
In formulas (M) and (N), R31
, R32 and R33 each independently represent
hydrogen, Cl-5 alkyl, Cl-5 alkoxy, Cl-5 alkoxycarbonyl or aryl, R34
represents (meth)acryloyl, vinyl, isocyanato, imidazole, mercapto,
amino, methylamino, dimethylamino, benzylamino, phenylamino,
cyclohexylamino, morpholino, piperazino, ureido or glycidyl, R35
represents hydrogen or methyl, and g is an integer of 1-10.
[0093] Preferred compounds represented by general formula (N) from
the standpoint of high adhesion and electrical reliability are compounds
wherein R31 is Cl-5 alkyl or aryl, R32 and R33 each independently
represent a C2-3 alkoxy group and g is 2-4.
[0094] These compounds may be used alone or in combinations of
two or more.
[0095] The adhesive composition of the invention may also contain a
radical polymerizing compound other than the aforementioned urethane
(meth)acrylate. Such radical polymerizing compounds are not
particularly restricted so long as they are radical polymerizing, such as
styrene derivatives or maleimide derivatives.
[0096] As examples of radical polymerizing compounds there may be
mentioned oligomers such as epoxy (meth)acrylate oligomers,
polyether (meth)acrylate oligomers and polyester (meth)acrylate
oligomers, and polyfunctional (meth)acrylate compounds such as
trimethylolpropane tri(meth)acrylate, polyethyleneglycol
di(meth)acrylate, polyalkyleneglycol di(meth)acrylate, dicyclop(mtenyl
(meth)acrylate, dicyclopentenyloxyethyl (meth)acrylate,
neopentylglycol di(meth)acrylate, dipentaerythritol hexa(meth)acrylate,
isocyanuric acid-modified bifunctional (meth)acrylates and isocyanuric
acid-modified trifunctional (meth)acrylates.
[0097] These compounds may be used alone or in combinations of
two or more.
[0098] For improved flow properties, the adhesive composition of the
invention may be combined with a monofunctional (meth)acrylate
compound, in addition to the compounds mentioned above. As
examples of monofunctional (meth)acrylate compounds there may be
mentioned pentaerythritol (meth)acrylate, 2-cyanoethyl (meth)acrylate,
cyclohexyl (meth)acrylate, dicyclopentenyl (meth)acrylate,
dicyclopentenyloxyethyl (meth)acrylate, 2-(2-ethoxyethoxy )ethyl
(meth)acrylate, 2-ethoxyethyl (meth)acrylate, 2-ethylhexyl
(meth)acrylate, n-hexyl (meth)acrylate, 2-hydroxyethyl (meth)acrylate,
hydroxypropyl (meth)acrylate, isobornyl (meth)acrylate, isodecyl
(meth)acrylate, isooctyl (meth)acrylate, n-lauryl (meth)acrylate, 2-
methoxyethyl (meth)acrylate, 2-phenoxyethyl (meth)acrylate,
tetrahydrofurfuryl (meth)acrylate, 2-(meth)acryloyloxyethyl phosphate,
N,N-dimethylaminoethyl (meth)acrylate, N,N-dimethylaminoethyl
(meth)acrylate, N,N-dimethylaminopropyl (meth)acrylate and
(meth)acryloylmorpholine.
[0099] These compounds may also be used alone or in combinations
of two or more.
[0100] For the purpose of improving the crosslinking rate, the
adhesive composition of the invention may include appropriately added
compounds with functional groups that polymerize by active radicals
such as allyl, maleimide and vinyl groups, in addition to the
aforementioned urethane (meth)acrylate or compound with other
(meth)acryloyl groups. As specific examples of such compounds
there may be mentioned N-vinylimidazole, N-vinylpyridine, Nvinylpyrrolidone,
N-vinylfonnamide, N-vinylcaprolactam, 4.4'vinylidenebis(
N,N-dimethylaniline ), N-vinylacetamide, N,Ndimethylacrylamide,
N-isopropylacrylamide, N,N-diethylacrylamide
and acrylamide.
[0101] These compounds may be used alone or in combinations of
two or more.
[0102] The adhesive composition of the invention may further
comprise a rubber component for the purpose of enhancing the stress
relaxation and adhesion. As examples of rubber components there
may be mentioned polyisoprene, polybutadiene, carboxyl-tenninated
polybutadiene, hydroxy-terminated polybutadiene, 1 ,2-polybutadiene,
carboxyl-terminated 1 ,2-polybutadiene, hydroxy-tenninated 1,2-
polybutadiene, acrylic rubber, styrene-butadiene rubber, hydroxyterminated
styrene-butadiene rubber, acrylonitrile-butadiene rubber,
acrylonitrile-butadiene rubber having carboxyl, hydroxyl,
(meth)acryloyl or morpholine groups at the polymer ends, carboxylated
nitrile rubber, hydroxy-terminated poly( oxypropylene ), alkoxysilylterminated
poly( oxypropylene ), poly( oxytetramethylene )glycol,
polyolefin glycols, poly-e-caprolactone, and the like.
[0103] Preferred among the aforementioned rubber components from
the viewpoint of improving adhesion are rubber components having
high polar cyano or carboxyl groups on side chams or the ends, while
liquid rubber is preferred from the viewpoint of improving the flow
property. As examples of such rubber components there may be
mentioned liquid acrylonitrile-butadiene rubber, liquid acrylonitrilebutadiene
rubber having carboxyl, hydroxyl, (meth)acryloyl or
morpholine groups at the polymer ends, and liquid carboxylated nitrile
rubber. These rubber components preferably contain 10-60 wt% of
acrylonitrile-derived polar groups.
[0104] The rubber components may be used alone or in combinations
of two or more.
[0105] The adhesive composition of the invention can be given
improved storage stability with appropriate addition of additives such
as polymerization inhibitors, typified by t-butylpyrocatechol, tbutylphenol,
p-methoxyphenol and the like.
[0 1 06] Stabilizers may also be added to the adhesive composition of
the invention for curing speed control and superior storage stability.
Such stabilizers are not particularly restricted and may be any known
stabilizers. Preferred among the known stabilizers are, for example,
quinone derivatives such as benzoquinone and hydroquinone, phenol
derivatives such as 4-methoxyphenol and 4-t-butylcatechol, aminoxyl
derivatives such as 2,2,6,6-tetramethylpiperidine-1-oxyl and 4-
hydroxy-2,2,6,6-tetramethylpiperidine-1-oxyl, and hindered amine
derivatives such as tetramethylpiperidyl methacrylate.
[0 1 07] The amount of stabilizer added to the adhesive composition is
preferably 0.01-30 parts by weight and niore preferably 0.05-10 parts
by weight with respect to 100 parts by weight of the thermoplastic
resin. If the amount of stabilizer added is less than 0.01 part by
weight the effect of addition will tend to be reduced, while if it is
greater than 30 parts by weight, compatibility with the other
components will tend to be lower.
[0 1 08] There may also be added to the adhesive composition of the
invention components other than the additives mentioned above, such
as fillers, softening agents, accelerators, age inhibitors, coloring agents
and flame retardants.
[0109] ·The adhesive composition of the invention may also be a
multiphase composition comprising two or more phases having Tg
(glass transition temperatures) differing by at least 5°C when cured.
[0 11 0] The. adhesive composition of the invention may also be a
combination of one according to the first embodiment and one
according to the second embodiment described above. For example,
the adhesive composition of the invention may be a combination of a
urethane (meth)acrylate according to the first embodiment and a
urethane (meth)acrylate according to the second embodiment.
[0 111] An adhesive of the invention may be used in paste form if it is
a liquid at ordinary temperature (25°C). If it is a solid at room
temperature (25°C), it may be heated for use, or formed into a paste
using a solvent. There are no particular restrictions on the solvent
used so long as it can thoroughly dissolve the adhesive components
without reacting with any of the components in the adhesive
composition. Such solvents having boiling points of 50-150°C at
ordinary pressure are preferred. If the boiling point is below 50°C,
volatilization will tend to occur while standing at room temperature,
thus limiting use in open systems. If the boiling point is higher than
150°C, volatilization of the solvent will be hampered, tending to
adversely affect the reliability after bonding.
[0112] The adhesive composition of the invention may also be used
after its shaping into a film. The method of forming a film of the
adhesive composition (adhesive film) may be the following, for
example. First, a solution obtained by adding a solvent as necessary
to the adhesive composition is coated onto a releasable base such as a
fluorine resin film, polyethylene terephthalate film or release sheet to
form a coated film. Next, the solvent is removed to convert the coated
film to a solid or semi-solid state and obtain an adhesive film.
Alternatively, the solution may be impregnated into a base material
such as a nonwoven fabric and placed over a releasable base, and the
solvent removed to obtain an adhesive film. Using the adhesive
composition as a film can provide further advantages from the
viewpoint of manageability.
(0113] The adhesive composition of the invention may also be
directly coated onto an adherend or placed on an adherend as an
adhesive film, and then subjected to heat and pressure for bonding onto
the adherend. The heating temperature is not particularly restricted
but is preferably 1 00-250°C. The pressure is not particularly
restricted so long as it is in a range that does not damage the adherend,
but normally a range of 0.1-10 MPa is preferred. The heat and
pressure are preferably applied for 0.5-120 seconds, and bonding can
be achieved even with heat and pressure at 140-200°C, 3 MPa for 10
seconds. After connection, the adhesive composition may be
subjected to post-curing. The connection may also be accomplished
using, instead of heat and pressure, some energy other than heat, such
as light, ultrasonic waves or electromagnetic waves.
[0114] The adhesive of the invention rriay be used as an adhesive for
adherends with different thermal expansion coefficients. Specifically,
it may be used as a circuit-connecting material such as an anisotropic
conductive adhesive, silver paste, silver film or the like, or as a
semiconductor element adhesive material such as a CSP elastomer,
CSP underfill material, LOC tape or the like.
[0115] When the adhesive composition is molded into a film to
produce an adhesive film and temporarily anchored onto a flexible
wiring board, the temporary anchoring strength on the flexible wiring
board is preferably 50 gf/cm-150 gf/cm. A temporary anchoring
strength of greater than 150 gf/cm will be excessive pressure-sensitive
adhesion, tending to hamper removal after attachment of flexible
wiring boards onto the adhesive film (circuit connection adhesive) and
lower the repairability. On the other hand, a temporary anchoring
strength of less than 50 gf/cm will be insufficient pressure-sensitive
adhesion, tending to result in flaking of the flexible wiring board from
the adhesive film. When the molecular structure of the urethane
(meth)acrylate does not include an ether structure, the pliability and
adhesion of the cured adhesive will be insufficient, thus significantly
. 40
err
lowering the connection reliability.
[0 116] The temporary anchoring strength onto flexible wiring boards
is measured in the following manner. First, a 15 J.ll1l adhesive film
(circuit-connecting material) with a thickness of 15 J.ll1l is temporarily
contacted bonded onto a PWB (printed wiring board) or a circuitformed
glass substrate, under conditions of 80°C, 1 :rv.tPa, 3 seconds.
The flexible wiring board is then contact bonded onto the adhesive film
under conditions of 23°C, 0.5 :rv.tPa, 5 seconds. The flexible wiring
board is released from the adhesive · filni under conditions with a
temperature of 23±3°C, a pull direction of 90° and a pull speed of 50
mm/min. The flexible wiring board and circuited-formed glass
substrate had the following dimensions.
Flexible wiring board: 75 J.LIIl polyimide film, 1/2 Oz (ounces), copper
foil tin plating, 0.2 mm pitch, electrode width/electrode spacing= 111.
Glass substrate: 15-20 n/o, total copper surface electrode by
sputtering, 1.1 mm thickness.
[0 117] The circuit member connection method of the invention will
now be explained using a preferred mode. Fig. 1 is a simplified crosssectional
view showing an embodiment of a circuit member connection
structure according to the invention. As shown in Fig. 1, the circuit
member connection structure of this embodiment is provided with a
first circuit member 20 and second circuit member 30 which face each
other, and a circuit-connecting member 10 is provided between the first
circuit member 20 and second circuit member 30 and connects them.
[0118] The first circuit member 20 is provided with a circuit board
(first circuit board) 21 and a circuit electrode (first circuit electrode) 22
...4-tl(
Z--
formed on the main surface 21 a of the circuit board 21. An insulating
layer (not shown) may also be formed on the main surface 21a of the
circuit board 21.
[0119] The second circuit member 30 is provided with a circuit board
(second circuit board) 31 and a circuit electrode (second circuit
electrode) 32 formed on the main surface 31a of the circuit board 31.
An insulating layer (not shown) may also be formed on the main
surface 31 a of the circuit board 31. The circuit boards 21, 31 may be
made of inorganic materials such as semiconductors, glass or ceramics,
organic substances such as polyimides, polycarbonates, polyesters or
polyethersulfones, or compound materials composed of such inorganic
or organic substances (for example, glass/polyepoxy resin).
[0120] The first and second circuit members 20, 30 are not
particularly restricted so long as electrodes requiring electrical
connection are formed thereon. Specifically, there may be mentioned
glass substrates or plastic substrates, printed circuit boards, ceramic
wiring boards, flexible wiring boards and the like on which electrodes
are formed by ITO for use in liquid crystal display devices, and they
may also be used in combination as necessary.
[0121] The circuit-connecting member 10 comprises an insulating
substance 11 and conductive particles 7. The conductive particles 7
are situated not only between the facing circuit electrode 22 and circuit
electrode 3 2, but also between the main surfaces 21 a, 31 a. In the
circuit member connection structure, the circuit electrodes 22, 32 are
electrically connected through the conductive particles 7. That is, the
conductive particles 7 are in direct contact with both of the circuit
electrodes 22, 32.
[0 1221, The conductive particles 7 correspond to the conductive
particles which may be present in the adhesive composition of the
invention as described above.
[0123] In this circuit member connection structure, the circuit
electrode 22 and circuit electrode 32 which are facing each other are
electrically connected through the conductive particles 7 as mentioned
above. Connection resistance between the circuit electrodes 22, 32
can therefore be sufficiently reduced. As a result it is possible to
achieve a smooth flow of current between the circuit electrodes 22, 32,
thereby allowing the function of the circuit to be satisfactorily
exhibited. When the circuit-connecting member 10 does not contain
conductive particles 7, the circuit electrode 22 and circuit electrode 32
come into direct contact to form an electrical connection.
[0124] As explained below, the circuit-connecting member 10 is·
composed of the cured product of a circuit-connecting material
containing the adhesive composition. Thus, even if the circuit boards
21, 31. and the circuit electrodes 22, 32 are composed of different
materials, the adhesive strength of the circuit-connecting member 1 0 on
the circuit member 20 or 30 will be sufficiently high. Adequately
high adhesive strength will also be maintained for prolonged periods in
a circuit member connection structure. It is therefore possible to
prevent changes in the distance between the circuit electrodes 22, 32
with time, so that long-term reliability of the electrical characteristics
between the circuit electro~es 22,32 can be increased.
[0125] A process for production of a circuit member connection
structure will now be explained.
[0 126] First, the first circuit member · 20 and circuit-connecting
material film 40 described above are prepared (see Fig. 2(a)). The
circuit-connecting material film 40 is obtained by forming the circuitconnecting
material into a film, and it may also be laminated with a
releasable support film. The circuit-connecting material film 40 is
usually pulled out from being wound on a winding core, and cut to the
necessary length. Since the circuit-connecting material film 40 in this
case includes an adhesive composition of the invention, lamination
with a support film and pulling out from a wound state will not result in
unsatisfactory back-side transfer of the circuit-connecting material film
40 onto the support film. The poor adhesion and poor connection that
occurs with back-side transfer onto support films are therefore
prevented.
[0 127] The circuit-connecting material comprises an adhesive
composition 5 containing . conductive particles 7. The adhesive
composition 5 used contains the structural materials described above.
Even if the circuit-connecting material does not contain conductive
particles 7, the circuit-connecting material can be used as an insulating
adhesive for anisotropic conductive bonding, in which case it is often
referred to as NCP (Non-Conductive Paste). When the circuitconnecting
material contains conductive particles 7, the circuitconnecting
material may be referred to as an ACP (Anisotropic
Conductive Paste).
(0 128] The content of the conductiv~ particles 7 in the circuitconnecting
material is preferably 0.1-30 vol% and more preferably 1.0-
20 vol% with respect to the total of the circuit-connecting material.
With a content of less than 0.1 vol%, it may be difficult to achieve
satisfactory conduction. At greater than 30 vol%, on the other hand, ·
shorting may occur with adjacent circuits.
(0129] The thickness of the circuit-connecting material film 40 is
preferably 5-50 Jlnl· If the thickness of the circuit-connecting material
film 40 is less than 5 Jlnl, the circuit-connecting material may not
sufficiently fill the space between the circuit electrodes 22, 32. On
the other hand, a thickness exceeding 50 J.LIIl may make it difficult to
sufficiently remove the adhesive composition between the circuit
electrodes 22, 32, often to an extent hampering conduction between the
circuit electrodes 22, 32.
[0130] The circuit-connecting material film 40 is placed over the side
of the first circuit member 20 on which the circuit electrode 22 has
been formed. When the circuit-connecting material film 40 is
attached to a support (not shown), it is placed on the first circuit
member 20 with the circuit-connecting material film 40 side facing the
first circuit member 20. The circuit-connecting material film 40 is a
film and is therefore easy to handle. Since it is therefore easy to
situate the circuit-connecting material film 40 between the first circuit
member 20 and second circuit member 3 0, connection between the first
circuit member 20 and second circuit member 3 0 is facilitated.
[0131] The circuit-connecting material film 40 is pressed m the
directions of the arrows A and B in Fig. 2(a) to temporarily anchor
(temporarily connect) the circuit-connecting material film 40 to the first
circuit member 20 (see Fig. 2(b)). The pressing may be accompanied
by heating. However, the heating must be at a temperature that does
not cure the adhesive composition in the circuit-connecting' material
film 40. Since the circuit-connecting material film 40 comprises an
adhesive composition of the invention, satisfactory temporary
anchoring is accomplished even when the first circuit member 20 is a
flexible wiring board.
[0132] When the circuit-connecting material film 40 is laminated with
a support film (not shown}, the support film is released. In this case,
the circuit-connecting material film 40 which comprises an adhesive
composition of the invention allows the support film to be satisfactorily
released.
[0133] The circuit-connecting material film 40 is then irradiated with
active light rays .. Next, as shown in Fig. 2(c), the second circuit
member 30 is placed on the circuit-connecting material film 40 with the
second circuit electrode facing the first circuit member 20. When the
circuit-connecting material film 40 is attached to a support (not shown),
the second circuit member 30 is placed on the circuit-connecting
material film 40 after releasing the support.
[0134] The circuit-connecting material film 40 is pressed, while
heating, via the frrst and second circuit members 20, 3 0 in the
directions of the arrows A and B in Fig. 2( c). The heating is carried
out at a temperature that allows curing of the adhesive composition of
the invention. The circuit-connecting material film 40 is thus cured,
forming the main connection to obtain a circuit member connection
structure as shown in Fig. 1. The connection conditions are
appropriately selected according to the purpose of use and according to
the adhesive composition and circuit member.
[0135] For example, the heating temperature may be 50-250°C and
preferably 50-190°C, while the pressure will generally be 0.1-10 MPa,
and the time required for heating and pressing (connection time) is 1
second-! 0 minutes and preferably 1-10 seconds.
[0136] As mentioned above, fabrication of a circuit member
connection structure allows the conductive particles 7 to contact with
both of the facing circuit electrodes 22, 32 in the circuit member
connection structure, thus adequately reducing connection resistance
between the circuit electrodes 22, 32.
[0137] Heating of the circuit-connecting material film 40 cures the
adhesive composition 5 to form an insulating material 11 with a
sufficiently small distance between the. circuit electrode 22 and circuit
electrode 32, so that the first circuit member 20 and· second circuit
member 30 are firmly bonded via the circuit-connecting member 10.
That is, since the circuit-connecting member 10 in the obtained circuit
member connection structure is constructed of the cured circuitconnecting
material comprising the adhesive composition, the adhesive
strength of the circuit-connecting member 1 0 for the circuit member 20
or 30 is sufficiently high, the adhesive strength being sufficiently high
particularly under high-temperature, high-humidity conditions.
Adequately high adhesive strength will also be maintained for
prolonged periods in the circuit member connection structure. It is
therefore possible to prevent changes in the distance between the
circuit electrodes 22, 32 of the obtained circuit member connection
structure with time, so that long-term reliability of the electrical
characteristics between the circuit electrodes 22,32 can be increased.
(0138] A preferred embodiment of a semiconductor device of the
invention will now be explained. Fig. 3 is a simplified cross-sectional
view showing an embodiment of a semiconductor device according to
the invention. As shown in Fig. 3, the semiconductor device 2 of this
embodiment comprises a semiconductor element 50 and a substrate 60
serving as the support member for the semiconductor, and a
semiconductor element connecting member 40 is provided between the
semiconductor element 50 and the substrate 60 for electrical connection
between them. The semiconductor element connecting member 40 is
laminated on the main suiface 60a of the semiconductor 60, while the
semiconductor element 50 is further laminated on the semiconductor
element connecting member 40.
[0139] The substrate 60 is provided with a circuit pattern 61, and the
circuit pattern 61 is electrically connected with the semiconductor
element 50, either directly or via the semiconductor connecting
member 40, on the main swface 60a of the substrate 60. These are
sealed with a sealing material 70 to form the semiconductor device 2.
(0 140] There are no particular restrictions on the material of the
semiconductor element 50, and there may be used Group 4
semiconductor elements such as silicon or germanium, Group III-V
compound semiconductor elements such as GaAs, InP, GaP, InGaAs,
InGaAsP, AlGaAs, InAs, GainP, AlinP, AlGalnP, GaNAs, GaNP,
GainNAs, GalnNP, GaSh, InSb, GaN, AlN, InGaN and InNAsP,
Group II-VI compound semiconductor elements such as HgTe,
HgCdTe, CdMnTe, CdS, CdSe, MgSe, MgS, ZnSe and ZeTe, and
CuinSe (CIS) or the like.
[0 141] The semiconductor element connecting member 40 includes
an insulating material 11 and conductive particles 7. The conductive
particles 7 are situated not only between the semiconductor element 50
and circuit pattern 61, but also between the semiconductor element 50
and the main surface 60a. In the semiconductor device 2 of this
embodiment, the semiconductor element 50 and circuit pattern 61 are
electrically connected via the conductive particles 7. Connection
resistance between the semiconductor element 50 and circuit pattern 61
is therefore adequately reduced. Consequently, smooth current flow
can be achieved betWeen the semiconductor element 50 and circuit
pattern 61, to allow the function of the semiconductor to be adequately
exhibited. In addition, adding the conductive particles 7 in the
proportion mentioned above can create electrical connection
anisotropy.
[0142] When the semiconductor element connecting member 40 lacks
the conductive particles 7, electrical connection is accomplished by
direct contact or sufficient proximity between the semiconductor
element 50 and circuit pattern 61 for the desired volume of current to
flow.
[0143] Since the semiconductor element connecting member 40 is
composed of the cured adhesive composition containing the adhesive
composition described above, the adhesive strength of the
semiconductor element connecting member 40 for the semiconductor
element 50 and substrate 60 is satisfactorily high, and the condition can
be maintained for prolonged periods. Consequently, long-term
reliability of electrical characteristics can be increased between the
semiconductor element 50 and substrate 60. Although a circuitconnecting
material film 40 was used for fabrication of the circuit
member connection structure in the embodiment described above, a
circuit-connecting material may ~e used instead of the circuitconnecting
material film 40. In this case as well, dissolving the
circuit-connecting material in a solvent and coating and drying the
solution on either or both the first circuit member 20 and second circuit
member 30 can form a circuit-connecting material between the first and
second circuit members 20, 30.
(0144] Another conductive material may also be used instead of
conductive particles 7. As other conductive materials there may be
mentioned particulate or staple fiber carbon, or metal wires such as Auplated
Ni wire.
Examples
(0145] The invention will now be explained in detail using examples,
with the understanding that the invention is in no way limited to these
examples.
(0146] (Synthesis ofurethane acrylate UA-A)
After introducing air gas into a reactor equipped with a stirrer,
thermometer, condenser tube and air gas inlet tube, there were charged
238 parts by weight (2.05 mol) of2-hydroxyethyl acrylate, 118 parts by
weight (1 mol) of 3-methyl-1,5-pentanediol (product of Wako Pure
Chemical Industries, Ltd.), 850 parts by weight (1 mol) of
polytetramethylene ether glycol with a weight-average molecular
weight of 8SO (trade name: PTG850 by Hodogaya Chemical Co., Ltd.),
0.18 part by weight of hydroquinonemonomethyl ether and 1.81 parts
by weight of dibutyltin dilaurate. Next, 630 parts by weight (3 mol)
of 2,4,4-trimethylhexamethylene diisocyanate was added dropwise to
the reactor uniformly over a period of 3 hours while heating the interior
of the reactor to 70-75°C, for reaction. Reaction was continued for
approximately 15 hours after completion of the dropwise addition, and
then the reaction was suspended upon confirming disappearance of
isocyanate based on IR measurement. This yielded urethane acrylate
UA-A with· a weight-average molecular weight of 4200.
[0147] (Synthesis ofurethane acrylate UA-B)
After introducing air gas into a reactor equipped with a stirrer,
thermometer, condenser tube and air gas inlet tube, there were charged
238 parts by weight (2.05 mol) of2-hydroxyethyl acrylate, 118 parts by
weight (1 mol) of 3-methyl-1 ,5-pentanediol (product of Wako Pure
Chemical Industries, Ltd.), 2000 parts by weight ( 1 mol) of
polytetramethylene ether glycol with a weight-average molecular
weight of 2000 (trade name: PTG2000 by Hodogaya Chemical Co.,
Ltd.), 0.53 part by weight of hydroquinonemonomethyl ether and 5.53
parts by weight of dibutyltin dilaurate. Next, 630 parts by weight (3
mol) of methyl-1 ,6-diisocyanatehexane was added dropwise to the
reactor uniformly over a period of 3 hours while heating the interior of
the reactor to 80-90°C, for reaction. Reaction was continued for
approximately 15 hours after completion of the dropwise addition, and
then the reaction was suspended upon confirming disappearance of
isocyanate based on IR measurement. This yielded urethane acrylate
UA-B with a weight-average molecular weight of9800.
[0148] (Synthesis ofurethane acrylate UA-C)
After introducing air gas into a reactor equipped with a stirrer,
thermometer, condenser tube and air gas inlet tube, there were charged
238 parts by weight (2.05 mol) of2-hydroxyethyl acrylate, 118 parts by
weight (1 mol) of 2-methyl-2,4-pentanediol (product of Wako Pure
Chemical Industries, Ltd.), 2000 parts by weight (1 mol) of
polytetramethylene ether glycol with a weight-average molecular
weight of 2000 (trade ·name: PTG2000 by Hodogaya Chemical Co.,
Ltd.), 0.53 part by weight of hydroquinonemonomethyl ether and 5.53
parts by weight of dibutyltin dilaurate. Next, 630 parts by weight (3
mol) of 2,4,4-trimethylhexamethylene diisocyanate was added
dropwise to the reactor uniformly over a period of 3 hours while
heating the interior of the reactor to 70-75·°C, for reaction. Reaction
was continued for approximately 15 hours after completion of the
dropwise addition, and then the reaction was suspended upon
confirming disappearance of isocyanate based on IR measurement
This yielded urethane acrylate UA-C with a weight-average molecular
weight of9200.
[0149] (Synthesis ofurethane acrylate UA-D)
After introducing air gas into a reactor equipped with a stirrer,
thermometer, condenser tube and air gas inlet tube, there were charged
238 parts by weight (2.05 mol) of2-hydroxyethyl acrylate, 118 parts by
weight (l mol) of 3-methyl-1,5-pentanediol (product of Wako Pure
Chemical Industries, Ltd.), 2000 parts by weight (1 mol) of
polytetramethylene ether glycol with a weight-average molecular
weight of 2000 (trade name: PTG2000 by Hodogaya Chemical Co.,
·52"'
.53
Ltd.), 0.64 part by weight of hydroquinonemonomethyl ether and 6.35
parts by weight of dibutyltin dilaurate. Next, 444 parts by weight (2
mol) of isophorone diisocyanate was added dropwise to the reactor
uniformly over a period of 3 hours while heating the interior of the
reactor to 80-90°C, for reaction. Reaction was continued for
approximately 15 hours after completion of the dropwise addition, and
then the reaction was suspended upon confmning disappearance of
isocyanate based on IR measurement. This yielded urethane acrylate
UA-D with a weight-average molecular weight of 11,500.
[0150] (Synthesis ofurethane acrylate UA-E)
After introducing air gas into a reactor equipped with a stirrer,
thermometer, condenser tube and air gas inlet tube, there were charged
238 parts by weight-(2.05 mol) of2-hydroxyethyl acrylate, 118 parts by
weight (1 mol) of 3-methyl-1,5-pentanediol (product of Wako Pure
Chemical Industries, Ltd.), 850 parts by weight (1 mol) of
polytetramethylene ether glycol with a weight-average molecular
weight of850 (trade name: PTG850 by Hodogaya Chemical Co., Ltd.),
0.18 part by weight of hydroquinonemonomethyl ether and 1.81 parts
by weight of dibutyltin dilaurate. Next, 630 parts by weight (3 mol)
of 2,4,4-trimethylhexamethylene diisocyanate was added dropwise to
the reactor uniformly over a period of 3 hours while heating the interior
of the reactor to 60-65°C, for reaction. Reaction was continued for
approximately 8 hours after completion of the dropwise addition, and
then the reaction was suspended upon confirming disappearance of
isocyanate based on IR measurement. This yielded urethane acrylate
UA-E with a weight-average molecular weight of2800.
[0151] (Synthesis ofurethane acrylate UA-F)
After introducing air gas into a reactor equipped with a stirrer,
thermometer, condenser tube and air gas inlet tube, there were charged
238 parts by weight (2.05 mol) of 2-hydroxyethyl acrylate, 4000 parts
by weight (2 mol) of polytetramethylene ether glycol with a weightaverage
molecular weight of 2000 (trade name: PTG2000 by Hodogaya
Chemical Co., Ltd.), 0.64 part by weight of hydroquinonemonomethyl
ether and 6.35 parts by weight of dibutyltin dilaurate. Next, 444 parts
by weight (2 mol) of isophorone diisocyanat~ was added dropwise to
the reactor uniformly over a period of 3 hours while heating the interior
of the reactor to 90-1 00°C, for reaction. Reaction was continued for
approximately 18 hours after completion of the dropwise addition, and
then the reaction was suspended upon confirming disappearance of
isocyanate based on IR measurement. This yielded urethane acrylate
UA-F with a weight-average molecular weight of 32,000.
[0 152] (Examples 1-4, Comparative Examples 1, 2)
A thermoplastic phenoxy resin (PKHC, trade name of Union Carbide
Corp., average molecular weight: 45,000) was dissolved in an amount
of 40 g in 60 g of methyl ethyl ketone to prepare a solution with a solid
content of 40 wt%. As radical polymerizing compounds there were
prepared an isocyanuric acid EO-modified diacrylate (trade name: M-
215 by Toagosei Co., Ltd.) and 2-(meth)acryloyloxyethyl phosphate
(trade name: LIGHT ESTER P-2M by Kyoeisha Chemical Co., Ltd.),
as urethane acrylates represented by general formula (A) there were
prepared UA-A, UA-B, UA-C, UA-D, UA-E and UA-F synthesized in
the manner described above, and as a radical generator (radical
polymerization initiator) there was prepared a 50 wt% dioctyl phthalate
(DOP) solution of t-hexylperoxy-2-ethyl hexanonate (trade name:
PERCURE HO by NOF·Corp.).
[0153] A nickel layer with a film thickness of0.20 llm was formed on
the surfaces of particles with a polystyrene core, and a gold layer with a
film thickness of0.02 f..Lm was formed on the outside ofthe nickel layer
to produce conductive particles with a mean particle size of 4 llffi and a
specific gravity of 2.5.
[0154] The prepared structural materials were combined in the solid
weight proportions shown in Table 1, and the conductive particles
prepared in the manner described above were dispersed therein at 1.5
vol% with respect to the adhesive component to obtain an adhesive
composition. A coating device was used to coat the obtained adhesive
composition onto a fluorine resin film with a thickness of 80 !lffi as a
support film, and the coating was hot air dried at 70°C for 10 minutes
to obtain an adhesive film. The film thickness of the circuitconnecting
material film on the support film was 15 !lm.
[0155] [Table 1]
j
Example Example Example Example Comp.Ex. Comp. Ex.
1 2 3 4 1 2
.Thermoplastic Phenol resin so so so so so so
resin
Radical M-21S 25 25 25 25 25 25
polymerizing LIGHT ESTER 5 5 5 s s s
compound P-2M
UA-A 20 - - - - -
UA-8 - 20 - - - -
Urethane UA-C - - 20 - - -
acrylate UA-D - - - 20 - -
UA-B - - - - 20 -
UA-P - - - - - 20
Radical PERCUREHO 3 3 3 3 3 3
I generator
[0 156] (Fabrication of circuit connection)
The obtained adhesive film was used for connection between a flexible
wiring board (FPC) having 500 copper circuits, with a line width of 25
jllll, a pitch of 50 jll1l and a thickness of 18 J.llll, and a glass substrate
(thic~ess: 1.1 mm, surface resistance: 200/o) having a 0.20 jll1l-~ck
indium oxide tin {ITO) thin-layer formed thereon, in the following
manner. FirSt, the adhesive film was situated on a glass substrate with
an ITO thin-layer already formed on its surface (hereinafter referred to
as "ITO-coated glass substrate"), so that the surface opposite the side
with the support film was facing the surface of the ITO thin-layer of the
ITO-coated glass substrate. Next, the adhesive film and ITO-coated
glass substrate were pressed via the support film while heating at 70°C,
1 MPa for 3 seconds, for temporary connection of the adhesive film on
the ITO~coated glass substrate. The support film was then released
from the adhesive film for transfer of the adhesive film onto the ITOcoated
glass substrate. Next, a flexible wiring board (FPC) with 600
tin-plated copper circuits, having a pitch of 50 J1tll and a thickness of 8
J.Uil, was situated on the adhesive film. These were then pressed in the
direction of lamination at 24°C, 0.5 MPa for 1 second to obtain a
temporarily anchored laminate. The laminate was situated at a
prescribed position in a thermocompression bonding apparatus (heated
system: constant heating, product of Toray Engineering), and pressing
was carried out in the direction of lamination while heating at 175°C, 3
MPa for 15 seconds. The ITO-coated glass substrate and flexible
wiring board were thus connected via a circuit-connecting member
across a width of2 mm to fabricate a circuit connection structure.
[0 157] ·(Measurement of connection resistance)
The resistance value between adjacent circuits of the circuit connection
structure was measured with a multimeter, immediately after bonding
and after holding for 120 hours in a ·high-temperature, high-humidity
environment of 85°C, 85% RH. The results are shown in Table 2.
The resistance value was represented as the average of 150 points of
resistance between adjacent circuits (x+3cr; x = mean value, cr =
standard deviation).
[0158] [Table 2]
Connection resistancejn_l Adhesive stre~mj_ Temporary
Immediately After 120 Immediately After 120 anchoring force
after bondinll hours after bonding hours, (gf/cm)
Example 1 1.9 2.3 1050 950 80
Example2 1.8 2.2 1120 1000 100
Examplc3 2.5 2.8 900 800 15
Example4 1.7 2.7 800 150 68
Comp.Ex.l 1.7 6.5 960 850 25
Comp.Ex.2 2.8 7.2 850 730 13
(0 159] (Measurement of adhesive strength)
The adhesive strength between the flexible wiring board and the ITOcoated
glass substrate in the circuit connection structure was measured
by the 90° peel method according to llS-Z0237. The measuring
apparatus used for the adhesive strength was a TENSILON UTM-4 by
Toyo Baldwin Co., Ltd. (peel rate: 50 mm/min, 25°C). The results
are shown in Table 2.
[0 160] (Evaluation of temporary anchoring force)
The temporary anchoring force on the flexible wiring board was
measured in the manner described above. The results are shown in
Table 2.
[0161] (Example 5)
There were prepared a semiconductor chip (3 x 10 mm, height: 0.5
mm, with 100 Jllll-square gold electrodes (bumps) protruding to a
height of 20 J.lii1 on the four peripheral sides of the main surface) and a
semiconductor mounting substrate fabricated from a 1 mm-thick
glass/epoxy substrate having connection terminals corresponding to the
bump positions (18 J.LIIl-thick circuits formed of copper foil). The
surface of the circuit on the semiconductor mounting substrate was
nickel/gold plated. The protruding electrodes of the semiconductor
chip and the semiconductor mounting substrate were connected in the
following manner using the adhesive film of Example 2 described
above. The circuit side of the semiconductor mounting substrate was
temporarily contact bonded at 80°C, 1 MPa for 3 seconds with an
adhesive film that was laminated with a support film. After then
releasing the support film, the protruding electrodes of the
semiconductor chip were positioned with the semiconductor mounting
substrate and thermocompression bonding was carried out for 20
seconds at a temperature and pressure of 180°C, 10 kgf/chip.
(0 162] This accomplished electrical connection between the
protruding electrodes of the semiconductor chip and the circuit of the
semiconductor mounting substrate via the adhesive film. The
electrodes of the semiconductor chip and the semiconductor mounting
substrate were kept in this connected state by curing of the adhesive
film by the thermocompression bonding. The semiconductor device
obtained in this manner by connecting the semiconductor chip and
semiconductor mounting substrate was subjected to a thermal cycle
test, repeating a cycle of (-55°C, 30 min)/(i25°C, 30 min). The
thermal cycle test was repeated for 1000 cycles, and then the
connection resistance between the semiconductor chip protruding
electrodes and the substrate circuit was measured. As a result,
virtually no increase in connection resistance was observed,
demonstrating that satisfactory connection reliability was exhibited~
[0163) As mentioned above, the adhesive compositions of Examples·
1-4 according to the invention used for connection between circuits or
the like provided sufficiently low connection resistance, and even after
120 hours of holding in a high-temperature, high-humidity tank there
was virtually no change from the resistance immediately after
connection. The adhesive strength was likewise satisfactory.
[0164] In contrast, the adhesive compositions of. Comparative
Examples 1 and 2, which employed urethane (meth)acrylates with a
weight-average molecular weight of less than 3000 or greater than
30,000, either already had high connection resistance immediately after
connection between the circuits, or had high connection resistance after
120 hours in the high-temperature, high-humidity tank. Also, because
the temporary anchoring force was less than 50 gf/cm, the pressuresensitive
adhesive force was weak and the flexible wiring board readily
peeled from the circuit-connecting adhesive.
[0 165] The adhesive composition of the invention has a superior
balance of properties, exhibiting a satisfactory transfer property and
providing good temporary anchoring onto flexible circuit boards, while
also having excellent storage stability and connection reliability.
[0166] (Synthesis ofurethane acrylate UA-1)
After introducing air gas into a reactor equipped with a stirrer,
thermometer, condenser tube and air gas inlet tube, there were charged
238 parts by weight (2.05 mol) of2-hydroxyethyl acrylate, 860 parts by
weight (1 mol) of poly(hexanemethylene carbonate)diol with a
number-average molecular weight of 860 (Aldrich Co.), 144 parts by
weight (1 mol) of 1 ,4-cyclohexanedimethanol, 0.19 part by weight of
hydroquinonemonomethyl ether and 1.91 parts by weight of dibutyltin
dilaurate. Next, 666 parts by weight (3 mol) of isophorone
diisocyanate was added dropwise to the reactor uniformly over a period
of 3 hours while heating the interior of the reactor to 70-75°C, for
reaction. Reaction was continued for approximately 15 hours after
completion of the dropwise addition, and then the reaction was
suspended upon confinning disappearance of isocyanate based on IR
measurement. This yielded urethane acrylate UA-1 with a weightaverage
molecular weight of3700.
[0167) (Synthesis ofurethane acrylate UA-2)
After introducing air gas into a reactor equipped with a stirrer,
thermometer, condenser tube and air gas inlet tube, there were charged
238 parts by weight (2.05 mol) of 2-hydroxyethyl acrylate, 2000 parts
by weight (1 mol) of poly(hexanemethylene carbonate )diol with a
number-average molecular weight of 2000 (Aldrich Co.}, 144 parts by
weight (1 mol) of 1,4-cyclohexanedimethanol, 0.30 part by weight of
hydroquinonemonomethyl ether and 3.05 parts by weight of dibutyltin
dilaurate: Next, 666 parts by weight (3 mol) of isophorone·
diisocyanate was added dropwise to the reactor uniformly over a period
of 3 hours wh,ile heating the interior of the reactor to 70-75°C, for
reaction. Reaction was continued for approximately 18 hours after
completion of the dropwise addition, and then the reaction was
suspended upon confirming disappearance of isocyanate based on IR
measurement. This yielded urethane acrylate UA-2 with a weightaverage
molecular weight of 5400.
[0168] (Synthesis ofurethane acrylate UA-3}
After introducing air gas into a reactor equipped with a stirrer,
thermometer, c-ondenser tube and air gas inlet tube, there were charged
238 parts by weight (2.05 mol) of 2-hydroxyethyl acrylate, 4000 parts
by weight (2 mol) of poly(hexanemethylene carbonate)diol with a
number-average molecular weight of 2000 (Aldrich Co.), 0.49 part by
weight of hydroquinonemonomethyl ether and 4.90 parts by weight of
dibutyltin dilaurate. Next, 666 parts by weight (3 mol) of isophorone
diisocyanate was added dropwise to the reactor uniformly over a period
of 3 hours while heating the interior of the reactor to 70-75°C, for
· reaction. Reaction was continued for approximately 15 hours after
completion of the dropwise addition, and then the reaction was
suspended upon confirming disappearance of isocyanate based on IR
measurement. This yielded urethane acrylate UA-3 with a weightaverage
molecular weight of 6800.
[0169) (Synthesis ofurethane acrylate UA;..4)
After introducing air gas into a reactor equipped with a stirrer,
thermometer, condenser tube and air gas inlet tube, there were charged
238 parts by weight (2.05 mol) of 2-hydroxyethyl acrylate, 1800 parts
by weight (2 mol) of poly( ethylene glycol)diol with a number-average
molecular weight of 900 (Aldrich Co.), 0.27 part by weight of
hydroquinonemonomethyl ether and 2. 70 parts by weight of dibutyltin
dilaurate. Next, 666 parts by weight (3 mol) of isophorone
diisocyanate was added dropwise to the reactor uniformly over a period
of 3 hours while heating the interior of the reactor to 70-75°C, for
reaction. Reaction was continued for approximately 15 hours after
completion of the dropwise addition, and then the reaction was
suspended upon confirming disappearance of isocyanate based on IR
measurement. This yielded urethane acrylate UA-4 with a weightaverage
molecular weight of 4800.
[0170] (Synthesis ofurethane acrylate UA-5)
After introducing air gas into a reactor equipped with a stirrer,
.-ez--
63
thermometer, condenser tube and air gas inlet tube, there were charged
238 parts by weight (2.05 mol) of2-hydroxyethyl acrylate, 0.16 part by
weight of hydroquinonemonomethyl ether and 1.58 parts by weight of
dibutyltin dilaurate. Next, 444 parts by weight (2 mol) of isophorone
diisocyanate was added dropwise to the reactor uniformly over a period
of 3 hours while heating the interior ofthe reactor to 70-75°C, for
reaction. Next, 900 parts by weight (1 mol) of poly( ethylene
glycol)diol with a number-average molecular weight of 900 (Aldrich
Co.) was added dropwise to the reactor over a period of 3 hours for
reaction. Reaction was continued for approximately 15 hours after
completion of the dropwise addition, and urethane acrylate UA-5 was
obtained upon confmning disappearance of isocyanate based. on IR
measurement.
[0171] (Examples 6-8, Comparative Examples 3, 4)
A phenoxy resin and a urethane resin were used as thermoplastic
resins. A phenoxy resin (PKHC, trade name of Union Carbide Corp.,
average molecular weight: 45,000) was dissolved in an amount of 40 g
in 60 g of methyl ethyl ketone to prepare a solution with a solid content
of 40 wt%. The urethane resin was synthesized in the following
manner. First, 450 parts by weight of polybutylene adipate diol with
an average molecular weight of 2000, 450 parts by weight of
polyoxytetramethylene glycol with an average molecular weight of
2000 and 100 parts by weight of 1 ,4-butylene glycol were uniformly
combined in 4000 parts by weight of methyl ethyl ketone. Next, 390
parts by weight of diphenylmethane diisocyanate was added and
reaction was carried out at 70°C to obtain a urethane resin with a
weight-average molecular weight of350,000.
[0 172] As a radical polymerizing compound there was prepared 2-
(meth)acryloyloxyethyl phosphate (trade name: LIGIIT ESTER P-2M
by Kyoeisha Chemical Co.~ Ltd.), as urethane (meth)acrylates having.
divalent molecules represented by general formula (G) and/or formula··
(H) above in the molecule there were prepared UA-1, UA-2, UA-3, ·
UA-4 and UA-5 synthesized in the manner described above, and as a
radical generator there was prepared t-hexylperoxy-2-ethyl hexanonate
(trade name: PERHEXYL 0 by NOF Corp.).
[0 173] A nickel layer with a film thickness of 0.20 J.llil was formed on
the surfaces of particles with a polystyrene core, and a gold layer with a
film thickness of 0.02 J.Uil was formed on the outside of the nickel layer
to produce conductive particles with a mean particle size of 4 Jltll and a
specific gravity of2.5.
[0174] The prepared structural materials were combined in the solid
weight proportions shown in Table 3, and the conductive particles
prepared in the manner described above were dispersed therein at 1.5
vol% with respect to the adhesive component to obtain an adhesive
composition. A coating device was used to coat the obtained adhesive
composition onto a fluorine resin film with a thickness of 80 J.Un as a
support film, and the coating was hot air dried at 70°C for 10 minutes
to obtain an adhesive film. The film thickness of the circuitconnecting
material film on the support film was 15 J.Un.
(0175] [Table 3]
Example Example Example Comp.Ex.3 Comp. Ex. 4
6 7 8
Thennoplastic Phenol resin 3S JS 3S JS JS
resin Urethane resin IS IS IS IS IS
Radical LIGHT ESTER
polymerizing P-2M s s s s s
compound
UA-1 4S - - - -
Urethane· UA-2 - 45 - - -
acrylate. . UA-3 - - 45 - -
UA-4 - - - 45 -
UA-S - - - - 45
Radical PERHEXYLO 3 3 3 3 3
generator
(0176] (Fabrication ofdrcuit connection)
The obtained adhesive film was used for connection between a flexible
wiring board (FPC) having 500 copper circuits, with a line width of 25
llffi, a pitch of 50 llffi and a thickness of 8 JUil, and a glass substrate
(thickness: 1.1 mm, surface resistance: 20 a /o) having a 0.20 l!ffi-thick
indium oxide tin (ITO) thin-layer formed thereon, in the following
manner. First, the adhesive film was situated on a glass substrate with
an ITO thin-layer already formed on its surface (hereinafter referred to
as "ITO-coated glass substrate"), so that the surface opposite the side
with the support film was facing the surface of the ITO thin-layer of the
ITO-coated glass substrate. Next, the adhesive film and ITO-coated
glass substrate were pressed via the support film while heating at 70°C,
1 :MPa for 3 seconds, for temporary connection of the adhesive film on
the ITO-coated glass substrate. The support film was then released
from the adhesive film for transfer of the adhesive film onto the ITOcoated
glass substrate. Next, a flexible wiring board (FPC} with 600
tin-plated copper circuits, having a pitch of 50 J.lli1 and a thickness of 8
~' was situated on the adhesive film. These were then pressed in the
direction of lamination at 24°C, 0.5 .MPa for 1 second to obtain a
temporarily anchored laminate. The laminate was situated at a
prescribed position in a thermocompression bonding apparatus (heated
system: constant heating, product of Toray E~gineering), and pressing
was carried out in the direction of lamination while heating at 160°C, 3
l'APa for 10 seconds. The ITO-coated glass substrate and flexible
wiring board were thus connected via a circuit-connecting member
across a width of 2 nun to fabricate a circuit connection structure.
[0 177] (Measurement of connection resistance)
The resistance value between adjacent circuits of the circuit connection
structure was measured with a multimeter, immediately after bonding
and after holding for 168 hours in a high-temperature, high-humidity
environment of 85°C, 85% RH. The results are shown in Table 4.
The resistance value was represented as the average of 37 points of
resistance between adjacent circuits (x+3cr; x = mean value, cr =
standard deviation).
[0 178] [Table 4]
Connection resistance (0) Adhesive streil&!!'!.lli/m_l
Immediately after After 168 hours Immediately after After 168 hours
bonding bonding
Example6 1.3 2.8 740 620
Example 7 1.6 2.6 860 680
Example 8 1.9 3.2 920 700
Comp.Ex. 3 l.S 6.8 680 320
Comp.Ex.4 1.4 3.1 480 260
(0 179] (Measurement of adhesive strength)
The adhesive strength between the flexible wiring board and the ITOcoated
glass substrate in the. circuit connection structure was measured
by the 90° peel method according to llS-Z0237. The measuring
apparatus used for the adhesive strength was a TENSILON UTM-4 by
Toyo Baldwin Co., Ltd. {peel rate: SO mm/min, 25°C). The results
are shown in Table 4.
[0180] When using the adhesive films of Examples 6-8, satisfactory
connection resistance and adhesive strength were exhibited
immediately after bonding and after holding for 168 hours in a hightemperature,
high-humidity environment of 85°C, 85% RH. On the
other hand, when using the adhesive film of Comparative Example 3,
the connection resistance value was satisfactory immediately after
bonding but the connection resistance value increased after holding for
168 hours in a high-temperature, high-humidity environment of 85°C,
85% RH (reliability test). The adhesive strength immediately after
bonding was also lower compared to Examples 6-8, while the reduction
in adhesive· strength after the reliability test was significant. In
Comparative Example 4, the connection resistance was satisfactory but
low adhesive strength was exhibited both immediately after bonding
and after the reliability test. This demonstrated that using a urethane
(meth)acrylate with the specific structure according to the invention
can provide satisfactory connection resistance and adhesive strength.
(0 181] (Example 9)
The adhesive film obtained in Example 6 was vacuum packaged and
allowed to stand at 40°C for three days. Thermocompression bonding
of a flexible wiring board and ITO-coated glass substrate was. then
carried out in the same manner as Example 6 to fabricate a circuit
connection structure. Measurement of the adhesive strength ·and
connection resistance of the obtained circuit connection structure
revealed an adhesive strength of 720 N/m and a connection resistance
of 1.6 n, thus demonstrating an excellent shelf life (storage stability).
[0182] (Example 10)
There were prepared a semiconductor chip (3 x 10 mm, height: 0.5
mm, with 100 J.Ull-square gold electrodes (bumps) protruding to a
height of 20 J.1Ill on the four peripheral edges of the main surface) and a
semiconductor mounting substrate fabricated from a 1 mm-thick
glass/epoxy substrate having connection terminals corresponding to the
bump positions (18 J.Uil-thick circuits formed of copper foil). The
surface of the circuit on the semiconductor mounting substrate was
nickel/gold plated. The protruding electrodes of the semiconductor
chip and the semiconductor mounting substrate were connected in the
following manner using the adhesive film of Example 8 described
above. The circuit side of the semiconductor mounting substrate was
temporarily contact bonded at 80°C, 1 :MPa for 3 seconds with an
adhesive film that was laminated with a support film. After then
releasing the support film, the protruding electrodes of the
semiconductor chip were positioned with the semiconductor mounting
substrate and thermocompression bpnding was carried out for 20
seconds at a temperature and pressure of 180°C, 10 kgf/chip.
[0183] This accomplished electrical connection between the
protruding electrodes of the semiconductor chip and the seniiconductor
mounting substrate via the adhesive film. The electrodes _of the
semiconductor chip and the semiconductor mounting substrate were
kept in this connected state by curing of the adhesive film by the
thermocompression bonding. The semiconductor device obtained in
this manner by connecting the semiconductor chip and semiconductor
mounting substrate was subjected to a thermal cycle test, repeating a
cycle of(-55°C, 30 min)/(125°C, 30 min). The thermal cycle test was
repeated for 1000 cycles, and then the connection resistance between
the semiconductor chip protruding electrodes and the substrate circuit
was measured. As a result, virtually no increase in connection
resistance 'Vas observed, demonstrating that satisfactory connection
reliability was exhibited.
[Industrial Applicability]
[0184] The present invention provides an adhesive composition with
an excellent balance of properties, which despite being a radical curing
adhesive, exhibits sufficiently high adhesive strength even for
substrates composed of metals and inorganic materials, has adequately
high storage stability and reliability at room temperature (20-30°C) and
satisfactory transfer properties onto adherends, and can satisfactorily
achieve temporary anchoring of flexible wiring boards and the like.




We claim:
1. A circuit-connecting material for electrical connection between opposing circuit
electrodes, the circuit-connecting material comprising an adhesive composition
comprising:
a radical generator,
a thermoplastic resin and
a urethane (meth)acrylate having two or more (meth)acryloyl groups and two or
more urethane bonds in the molecule, and also having a divalent group represented by
the following general formula (G) and/or formula (H):
-cH 2-o-H~c - (H)
wherein, p represents an integer of0-10 and q represents an integer of 1-20.
2. A circuit-connecting material for electrical connection between opposing circuit
electrodes as claimed in claim 1, wherein the urethane (meth)acrylate includes a
compound represented by the following general formula (1):
( I )
71
wherein R 11 represents hydrogen or a methyl group, R 12 represents a C 1-4
straight-chain or branched alkylene group, R13 represents a divalent organic group with
an aliphatic hydrocarbon group, R14 represents a divalent group represented by general
formula (G) and/or formula (H) above, and r represents an integer of 1-60, and the
plurality ofRll, R12 and R13 groups in the molecule and R14 where r is an integer of2-60
may be the same or different.
3. A circuit-connecting material for electrical connection between opposing circuit
electrodes as claimed in claim 1 or 2, wherein R 13 is at least one group selected from the
group consisting of divalent organic groups represented by formula (G) and general
formula (H) above.
4. A circuit-connecting material for electrical connection between opposing circuit
electrodes as claimed in any one of claims 1 to 3, wherein the temporary anchoring force
for temporary anchoring to a flexible wiring board is 50 gf/cm-150 gf/cm.
5. A circuit-connecting material for electrical connection between opposing circuit
electrodes as claimed in any one of claims 1 to 4, wherein the 25°C viscosity of the
urethane (meth)acrylate is 5.0 Pa·s or greater.
6. A circuit-connecting material for electrical connection between opposing circuit
electrodes as claimed in any one of claims 1 to 5, wherein the adhesive composition
comprises 10-250 parts by weight of the urethane (meth)acrylate and 0.05-30 parts by
weight of the radical generator with respect to 100 parts by weight of the thermoplastic
resm.
7. A circuit-connecting material for electrical connection between opposing circuit
electrodes as claimed in any one of claims 1 to 6, wherein the adhesive composition also
comprises a vinyl compound containing one or more phosphate groups in the molecule.
8. A circuit-connecting material for electrical connection between opposing circuit
electrodes as claimed in claim 7, wherein the adhesive composition comprises 0.1-20
72
parts by weight of the vinyl compound with respect to 100 parts by weight of the
thermoplastic resin.
9. A circuit-connecting material for electrical connection between opposing circuit
electrodes as claimed in any one of claims 1 to 8, wherein the adhesive composition
further comprises conductive particles.
10. A circuit-connecting material for electrical connection between opposing circuit
electrodes as claimed in claim 9, wherein the adhesive composition comprises 0.5-30
parts by weight of the conductive particles with respect to 100 parts by weight of the
thermoplastic resin.
11. A circuit-connecting material for electrical connection between opposing circuit
electrodes as claimed in any one of claims 1 to 10, incorporated in an adhesive film
comprising a base material.
12. A circuit member connection structure, employing a circuit-connecting material
as claimed in any one of claims 1 to 11, comprising
a first circuit member having a first circuit electrode formed on the main surface
of a first circuit board,
a second circuit member having a second circuit electrode formed on the main
surface of a second circuit board, and
a circuit-connecting member formed between the main surface of the first circuit
board and the main surface of the second circuit board, which electrically connects the
first circuit electrode and second circuit electrode which are positioned opposite each
other,
wherein the circuit-connecting member is the cured product of the circuitconnecting
material.
73
13. A circuit member connection structure as claimed in claim 12, wherein at least of
the first circuit member and the second circuit member is a flexible wiring board.
14. A circuit member connection structure as claimed in claim 12, wherein the first
circuit member and the second circuit member are any one of tape carrier packages, chipon-
flexes, and flexible printed circuit boards.
15. A method for producing a circuit member connection structure, employing a
circuit- connecting material as claimed in claim 11, the method comprising the steps of:
placing the circuit-connecting material on a first circuit member, wherein the first
circuit member has a first circuit board and a first circuit electrode formed on the main
surface of the first circuit board and wherein the circuit-connecting material is placed
over the side of the first circuit member on which the first circuit electrode has been
formed;
temporarily anchoring the circuit-connecting material to the first circuit member;
releasing the base material from the circuit-connecting material;
placing a second circuit member on the circuit-connecting material, wherein the
second circuit member has a second circuit board and a second circuit electrode formed
on the main surface of the second circuit board and wherein the second circuit member is
placed over the circuit-connecting material so that the second circuit electrode faces the
first circuit member; and
pressing the circuit-connecting material while heating, via the first and second
circuit members.
16. A semiconductor device, employing a circuit-connecting material as claimed in
any one of claims 1 to 11, comprising
a semiconductor element,
a substrate on which the semiconductor element is mounted, and
74
a semiconductor element connecting member provided between the
semiconductor element and the substrate and electrically connecting the semiconductor
element and the substrate,
wherein the semiconductor element connecting member is the cured product of
the circuit-connecting material.
Dated this 19th day of December, 2011.

Documents:

http://ipindiaonline.gov.in/patentsearch/GrantedSearch/viewdoc.aspx?id=nr4+YBsEpD4bbyEU6o9rdQ==&loc=+mN2fYxnTC4l0fUd8W4CAA==


Patent Number 279720
Indian Patent Application Number 10035/DELNP/2011
PG Journal Number 05/2017
Publication Date 03-Feb-2017
Grant Date 30-Jan-2017
Date of Filing 19-Dec-2011
Name of Patentee HITACHI CHEMICAL COMPANY, LTD.
Applicant Address 9-2, MARUNOUCHI 1-CHOME CHIYODA-KU, TOKYO 100-6606 JAPAN
Inventors:
# Inventor's Name Inventor's Address
1 KATOGI, SHIGEKI C/O HITACHI CHEMICAL COMPANY, LTD., 13-1, HIGASHI-CHO 4-CHOME, HITACHI-SHI, IBARAKI 317-8555, JAPAN
2 IZAWA, HIROYUKI C/O HITACHI CHEMICAL COMPANY, LTD., 48, WADAI, TSUKUBA-SHI, IBARAKI 300-4247, JAPAN
3 SUTOU, HOUKO C/O HITACHI CHEMICAL COMPANY, LTD., 13-1, HIGASHI-CHO 4-CHOME, HITACHI-SHI, IBARAKI 317-8555, JAPAN
4 YUSA, MASAMI C/O HITACHI CHEMICAL COMPANY, LTD., 48, WADAI, TSUKUBA-SHI, IBARAKI 300-4247, JAPAN
5 FUJINAWA, TOHRU C/O HITACHI CHEMICAL COMPANY, LTD., 1500, OGAWA, CHIKUSEI-SHI IBARAKI 308-8521, JAPAN
PCT International Classification Number C09J 175/16
PCT International Application Number PCT/JP2006/305092
PCT International Filing date 2006-03-15
PCT Conventions:
# PCT Application Number Date of Convention Priority Country
1 P2005-074999 2005-03-16 Japan
2 P2005-074913 2005-03-16 Japan